ATPG for ultra-large structured designs

Waicukauski, J.A.; Shupe, P.A.; Giramma, D.; Matin, A.

doi:10.1109/test.1990.113999

Cited by 58 publications

(11 citation statements)

References 9 publications

(14 reference statements)

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“…In a complete test pattern generation system, fault simulation would be employed to reduce the test set size, and to randomly detect some difficult detectable faults, as proposed in [13], [15] and [21]. We further note that our implementation of SOCRATES* has some relevant differences with respect to the original algorithm [15,16].…”

Section: Resultsmentioning

confidence: 99%

Dynamic search-space pruning techniques in path sensitization

Silva

Sakallah

1994

Proceedings of the 31st Annual Conference on Design Automation Conference - DAC '94

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Abstract-A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path sensitization can be posed as a search, in the n-dimensional Boolean space, for a consistent assignment of logic values to the circuit nodes which also satisfies a given condition. In this paper we propose and demonstrate the effectiveness of several new techniques for search-space pruning for test pattern generation. In particular, we present linear-time algorithms for dynamically identifying unique sensitization points and for dynamically maintaining reduced head line sets. In addition, we present two powerful mechanisms that drastically reduce the number of backtracks: failure-driven assertions and dependency-directed backtracking. Both mechanisms can be viewed as a form of learning while searching and have analogs in other application domains. These search pruning methods have been implemented in a generic path sensitization engine called LEAP. A test pattern generator, TG-LEAP, that uses this engine was also developed. We present experimental results that compare the effectiveness of our proposed search pruning strategies to those of PODEM, FAN, and SOCRATES. In particular, we show that LEAP is very efficient in identifying undetectable faults and in generating tests for difficult faults.

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Section: Resultsmentioning

confidence: 99%

Dynamic search-space pruning techniques in path sensitization

Silva

Sakallah

1994

Proceedings of the 31st Annual Conference on Design Automation Conference - DAC '94

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“…Test generation procedures for combinational circuits have been proposed, aimed at generating test sets that achieve complete fault coverage [1][2][3][4][5][6]. With this progress, attention has been diverted to the generation of small test sets [7][8][9][10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits

Kajihara¹,

Pomeranz²,

Kinoshita³

et al. 1993

Proceedings of the 30th International on Design Automation Conference - DAC '93

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New coat-effective heuristics for the generation of small test sets are introduced, and heuristics proposed previously are enhanced. An improved procedure is atso propased for computing independent fault sets which are used to sekcet target faults in test generation. The procedure results in large lower bounds on the minimum test set size. Experimentalrextdts of text generation demonstrate the effective= of the heuristics

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“…Reverse order simulation [5,6], compatibility analysis of partially specified vectors [7], forced pair merging along with essential fault pruning [8], and redundant vector elimination along with essential fault reduction [9] are the most notable ones. Similarly, many heuristics have been proposed for dynamic test compaction in combinational circuits [10].…”

Section: Related Workmentioning

confidence: 99%