Abstract:Point defects nearby a Frank‐type stacking fault in a commercial GaAs:Si wafer (with the Si concentration of about 1018 cm–3) were examined by ultrahigh‐vacuum cross‐sectional scanning tunneling microscopy (UHVXSTM). The defects were identified as pairs of a Si donor and a Ga vacancy. Even though the pairs were electrically neutral, the Si donors in the pairs might be active when they were in the bulk crystal, since the Ga vacancies in the pairs were considered to be introduced after the UHV‐XSTM specimen prep… Show more
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