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Yokoyama, Kousuke; Ochi, T.; Sugawara, Yasuhiro; Morita, Seizo

doi:10.1103/physrevlett.83.5023

Cited by 62 publications

(39 citation statements)

References 23 publications

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“…By FM-AFM, a zero-bias operation became possible which allowed the study of the defects without moving them by the electric field. Yokoyama et al (1999), in the same group, imaged Ag on Si by FM-AFM. In Fig.…”

Section: A Imagingmentioning

confidence: 99%

Advances in atomic force microscopy

2003

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This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms. CONTENTS

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Section: A Imagingmentioning

confidence: 99%

Advances in atomic force microscopy

2003

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“…In particular, appearance of the ring-type Sn is not observed at all, even though jDfj is small enough (Z tip-sample is long enough). It is well known that the NC-AFM images can be modified by the condition of the tip apex [28,29]. The ideal Si tip apex with a dangling bond is regarded as being neutral, but the state of the tip apex can change while scanning on the surface.…”

Section: Resultsmentioning

confidence: 99%

Study on topographic images of Sn/Si(111)-(√3×√3)R30° surface by non-contact AFM

Sugimoto

Nishi

et al. 2006

Surface Science

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“…This technique has been used to produce images of many materials down to atomic resolution. 11 The key advantages of AFM over other techniques are its ability to produce images of both insulating and conducting surfaces in air or liquids without special sample preparation. The technique has therefore been applied to study the MIP membranes and has been shown to be a versatile tool for the determination of key important properties of membranes, including pore size and surface roughness.…”

Section: Introductionmentioning

confidence: 99%

Characterization of molecularly imprinted composite membranes using an atomic force microscope

Hilal¹,

Kochkodan²,

Al-Khatib³

et al. 2002

Surface & Interface Analysis

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Atomic force microscopy (AFM) has been used to investigate the surface structure of molecularly imprinted polyethersulphone (PES) membranes and to quantify pore size and surface roughness. Molecularly imprinted polymeric (MIP) membranes were developed using photoinitiated copolymerization of 2-hydroxyethyl methacrylate as functional monomer and trimethylopropane trimethacrylate as crosslinker in the presence of adenosine 3 : 5 -cyclic monophosphate as template, followed by deposition of a MIP layer on the surface of (PES) microfiltration membranes. Atomic force microscopy images clearly indicate that a consistent increase in the degree of modification leads to a systematic decrease in pore size and an increase in surface roughness. These results show a good correlation with the filtration data of cAMP solutions. Thus, it was shown that direct AFM quantification of key parameters of imprinted membrane structure provide useful guidelines for the development of novel MIP composite membranes.

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Atomically Resolved Silver Imaging on theSi(111)−(3×3

Cited by 62 publications

References 23 publications

Advances in atomic force microscopy

Advances in atomic force microscopy

Study on topographic images of Sn/Si(111)-(√3×√3)R30° surface by non-contact AFM

Characterization of molecularly imprinted composite membranes using an atomic force microscope

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