Abstract:A detailed three-dimensional structural analysis of single-walled carbon nanotubes was carried out using a scanning tunneling microscope (STM) operated at room temperature in ambient conditions. On a microscopic scale, the images show tubes condensed in ropes as well as tubes which are separated from each other. For a single-wall nanotube rope, the outer portion is composed of highly oriented nanotubes with nearly uniform diameter and chirality. On separated nanotubes, atomically resolved images show variable … Show more
“…Topographic imaging can be combined with tunneling spectroscopy measurements. [5][6][7][8] This is a powerful technique since the predicted relation between atomic and electronic structure can be tested. STM measurements indeed confirmed that nanotubes can be either semiconducting or metallic, depending on the chirality and diameter.…”
The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (n,m). The electronic and mechanical properties are critically dependent on these indices. Scanning tunneling microscopy ͑STM͒ is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (n,m) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. Image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of (n,m) identification is demonstrated for a few single-walled carbon nanotubes.
“…Topographic imaging can be combined with tunneling spectroscopy measurements. [5][6][7][8] This is a powerful technique since the predicted relation between atomic and electronic structure can be tested. STM measurements indeed confirmed that nanotubes can be either semiconducting or metallic, depending on the chirality and diameter.…”
The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (n,m). The electronic and mechanical properties are critically dependent on these indices. Scanning tunneling microscopy ͑STM͒ is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (n,m) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. Image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of (n,m) identification is demonstrated for a few single-walled carbon nanotubes.
“…High quality and well-aligned carbon nanotubes are essential for the applications in the field of nanoelectronics and many of these applications are dependent upon the chirality and diameter of CNTs [7]. The nanotubes can be either metallic or semiconducting depending upon their diameter and chirality.…”
“…[2][3][4][5][6][7][8][9][10][11] These predictions have been confirmed by Raman experiments 12) and direct measurements of local density of states by scanning tunneling spectroscopy. [13][14][15] In this paper we shall investigate effects of potential scattering in metallic nanotubes in the case of the presence of several current carrying channels.…”
It is proved that a conducting channel transmitting perfectly without backscattering is present independent of energy in metallic carbon nanotubes for scatterers with potential range larger than the lattice constant. In the case that several traveling channels are present, the conductance decreases from the ideal value determined by the number of traveling modes to the single-channel value when the length exceeds the mean free path determined by a Boltzmann transport equation. Further, inelastic scattering makes the conductance decrease in proportion to the inverse of the length in qualitative agreement with the Boltzmann result.
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