2019
DOI: 10.1007/978-3-030-00069-1_1
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Atomic Resolution Transmission Electron Microscopy

Abstract: This chapter provides an overview of the essential theory and instrumentation relevant to highresolution imaging in the transmission electron microscope together with selected application examples. It begins with a brief historical overview of the field. Subsequently, the theory of image formation and resolution limits are discussed. We then discuss the effects of the objective lens through the wave aberration function and coherence of the electron source. In the third section, the key instrument components im… Show more

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Cited by 7 publications
(4 citation statements)
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“…1, the sum is over individual lipid atoms, ρ i ( w ) is the atom’s time-averaged atomic number density profile (units of Å -3 ) calculated from the MD simulation trajectory, and V i is the spatially integrated, shielded coulomb potential for an isolated neutral atom ( V i = 25, 130, 108, 97, and 267 V Å 3 for H, C, N, O and P, respectively). The phase shift experienced by an electron wave passing through the bilayer is given by: where σ e accounts for the dependence of the electron phase on the projected potential and is equal to 0.65 mrad V -1 Å -1 for 300 keV electrons (38). Following Wang et al, we refer to g ( w ) as the electron ‘scattering profile’ of the flat simulated bilayer; as Φ has units of V , the scattering profile has units of mrad Å -1 .…”
Section: Methodsmentioning
confidence: 99%
“…1, the sum is over individual lipid atoms, ρ i ( w ) is the atom’s time-averaged atomic number density profile (units of Å -3 ) calculated from the MD simulation trajectory, and V i is the spatially integrated, shielded coulomb potential for an isolated neutral atom ( V i = 25, 130, 108, 97, and 267 V Å 3 for H, C, N, O and P, respectively). The phase shift experienced by an electron wave passing through the bilayer is given by: where σ e accounts for the dependence of the electron phase on the projected potential and is equal to 0.65 mrad V -1 Å -1 for 300 keV electrons (38). Following Wang et al, we refer to g ( w ) as the electron ‘scattering profile’ of the flat simulated bilayer; as Φ has units of V , the scattering profile has units of mrad Å -1 .…”
Section: Methodsmentioning
confidence: 99%
“…Additionally, the fibers once washed with water to remove the PEO core and the TEM analysis of the ensuing hollow structure can confirm the complete removal of the PEO core while the chitosan shell maintains its physical structure [75]. High-resolution transmission electron microscopy (HRTEM) is a variant of TEM with resolutions below 0.5 Å [159] which facilitates the imaging of specimens at an atomic scale and enables the analysis of the atomic structure of the samples [159]. HRTEM has been an invaluable asset in the analysis of biopolymer-assisted formation of nanoparticles including the study of their crystal planes [160][161][162], the crystal structure of cellulose [163], nanocomposites [164,165], and even in the molecular orientations of biopolymers [166].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%
“…HRTEM has been an invaluable asset in the analysis of biopolymer-assisted formation of nanoparticles including the study of their crystal planes [160][161][162], the crystal structure of cellulose [163], nanocomposites [164,165], and even in the molecular orientations of biopolymers [166]. TEM with resolutions below 0.5 Å [159] which facilitates the imaging of specimens at an atomic scale and enables the analysis of the atomic structure of the samples [159]. HRTEM has been an invaluable asset in the analysis of biopolymer-assisted formation of nanoparticles including the study of their crystal planes [160][161][162], the crystal structure of cellulose [163], nanocomposites [164,165], and even in the molecular orientations of biopolymers [166].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%
“…In addition, modern microscopes are equipped with additional analytical accessories, such as X-ray spectroscopy (both wavelength and energy dispersion), electron backscatter diffraction (EBSD), Auger electron spectroscopy (AE), or cathodoluminescence (CL), to allow a deeper characterization of the sample and to provide further information on the chemical content of the samples. Although instrumental development has brought resolution to the nanometric level for SEM and even beyond for TEM [1], electron microscopy remains essentially a visualization technique, where the spatial arrangement of the constituents is represented in a two-dimensional image. The possibility of a three-dimensional (3D) reconstruction in the micrometer range required the long-awaited integration of computer-assisted methods with the imaging capability of electron microscopes.…”
Section: Introductionmentioning
confidence: 99%