2007
DOI: 10.1016/j.cpart.2006.09.001
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Atomic resolution in noncontact AFM by probing cantilever frequency shifts

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“…Morphology of the surfaces was studied by SPM that has used a NC-AFM mode. NC-AFM mode which is also referred to as a tapping mode characterizes the profile of brittle surface morphology and nanostructure of high precision (Kolodziej et al 2006;Xie 2007). Tapping on soft or brittle surfaces by thick probe oscillation of Figure 3.…”
Section: Materials Structure Characterizationmentioning
confidence: 99%
“…Morphology of the surfaces was studied by SPM that has used a NC-AFM mode. NC-AFM mode which is also referred to as a tapping mode characterizes the profile of brittle surface morphology and nanostructure of high precision (Kolodziej et al 2006;Xie 2007). Tapping on soft or brittle surfaces by thick probe oscillation of Figure 3.…”
Section: Materials Structure Characterizationmentioning
confidence: 99%