2013
DOI: 10.3740/mrsk.2013.23.8.405
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Atomic Layer Deposition: Overview and Applications

Abstract: Atomic layer deposition(ALD) is a promising deposition method and has been studied and used in many different areas, such as displays, semiconductors, batteries, and solar cells. This method, which is based on a self-limiting growth mechanism, facilitates precise control of film thickness at an atomic level and enables deposition on large and three dimensionally complex surfaces. For instance, ALD technology is very useful for 3D and high aspect ratio structures such as dynamic random access memory(DRAM) and o… Show more

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Cited by 17 publications
(2 citation statements)
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“…The ALD method involves self-limiting reactions on the substrate surface with precise control of film thickness, high conformality, and high film crystallinity. 19 Thus, ALD is considered to be a good candidate for synthesizing 2D materials. In addition, we conducted post-deposition annealing to improve the crystallinity of SnS 2 with an H 2 S and Ar gas mixture.…”
Section: Introductionmentioning
confidence: 99%
“…The ALD method involves self-limiting reactions on the substrate surface with precise control of film thickness, high conformality, and high film crystallinity. 19 Thus, ALD is considered to be a good candidate for synthesizing 2D materials. In addition, we conducted post-deposition annealing to improve the crystallinity of SnS 2 with an H 2 S and Ar gas mixture.…”
Section: Introductionmentioning
confidence: 99%
“…26,38 Here, we describe the fabrication of zinc-doped SnS 2 nanosheet-based thin films using atomic layer deposition (ALD) in a cycle consisting of a precursor pulse-purge-reactant pulse-purge step and separate injections of the precursor and reactant. 31,32 The content of impurities other than zinc in the film was minimal due to the use of a bypass process in the middle of the cycle. In addition, due to the self-limited reactions on the surface, it was possible to precisely control the nanoscale thickness compared to other fabrication processes.…”
Section: ■ Introductionmentioning
confidence: 99%