2019
DOI: 10.3390/coatings9050301
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Atomic Layer Deposition of NiO to Produce Active Material for Thin-Film Lithium-Ion Batteries

Abstract: Atomic layer deposition (ALD) provides a promising route for depositing uniform thin-film electrodes for Li-ion batteries. In this work, bis(methylcyclopentadienyl) nickel(II) (Ni(MeCp) 2 ) and bis(cyclopentadienyl) nickel(II) (NiCp 2 ) were used as precursors for NiO ALD. Oxygen plasma was used as a counter-reactant. The films were studied by spectroscopic ellipsometry, scanning electron microscopy, atomic force microscopy, X-ray diffraction, X-ray reflectometry, and X-ray photoelectron spectroscopy. The resu… Show more

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Cited by 62 publications
(47 citation statements)
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References 75 publications
(82 reference statements)
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“…The deconvolution of the Ni2p spectra recorded for NPs placed on the TiO 2 NTs ( Figure 4 c), however, shows more complex surface chemistry, revealing an additional peak doublet. The Ni2p 3/2 peak located at 853.7 eV belongs to NiO, with the Ni2p 3/2 NiO satellite merging with Ni(OH) 2 at approximately 861 eV [ 58 , 60 ]. Based on the proposed deconvolution, the share of the dehydrated NiO in the TiO 2 NTs decorated with NiNPs is around 20%.…”
Section: Resultsmentioning
confidence: 99%
“…The deconvolution of the Ni2p spectra recorded for NPs placed on the TiO 2 NTs ( Figure 4 c), however, shows more complex surface chemistry, revealing an additional peak doublet. The Ni2p 3/2 peak located at 853.7 eV belongs to NiO, with the Ni2p 3/2 NiO satellite merging with Ni(OH) 2 at approximately 861 eV [ 58 , 60 ]. Based on the proposed deconvolution, the share of the dehydrated NiO in the TiO 2 NTs decorated with NiNPs is around 20%.…”
Section: Resultsmentioning
confidence: 99%
“…In terms of the ALD process, the thermal ALD (T-ALD) generally leads to a larger surface roughness (e.g., RMS=0.61.25 nm for 1822 nm NiO films) [2,19,46]; however, our PE-ALD process can attain an improved film roughness, i.e., RMS=0.230.37 nm for 20 nm NiO films, as well as a relatively low deposition temperature (e.g., 225°C). Compared to the reactants of NiCp 2 and O 3 [47], the adoption of NiCp 2 and O 2 -plasma in our case can achieve not only a higher growth rate but also less carbon impurities in the NiO film.…”
Section: Physical Characterization Of the Nio Filmsmentioning
confidence: 89%
“…, with oxygen plasmas respectively. 9,[20][21][22] These studies have demonstrated that conformal growth of NiO is possible with cyclopentadienyl based nickel precursors and O 2 plasma. Given the low cost of nickelocene (Ni(Cp) 2 ), it should be an attractive precursor for ALD.…”
Section: Introductionmentioning
confidence: 99%
“…12 %) within deposited films. 22 Here we present a direct-plasma method for the deposition of NiO using the precursor Ni(Cp) 2 , and O 2 plasma, the process was utilised in a new fabrication process for 3D nanostructured arrays, for application in photoelectrochemical water splitting. A systematic investigation has determined that the process is a highly efficient and produced uniform and reproducible NiO with low carbon content.…”
Section: Introductionmentioning
confidence: 99%