Atomic Force Microscopy Measurement of the Resistivity of Semiconductors

Smirnov, V. A.; Tominov, R. V.; Alyab’eva, N. I.; Il’ina, M. V.; Polyakova, V. V.; Bykov, A. V.; Агеев, О. А.

doi:10.1134/s1063784218080182

Cited by 11 publications

(3 citation statements)

References 17 publications

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“…In many existing methods for manufacturing high aspect ratio probes, besides the aforementioned wet etching of silicon techniques, common approaches include dry etching or a combination of dry and wet etching, FIB milling, − and electron beam-induced deposition (EBID) . While wet etching offers cost advantages, KOH etching is highly dependent on crystal orientation and demands strict mask alignment; HF: HNO 3 : CH 3 COOH etching struggles to maintain a stable etching rate .…”

Section: Preparation and Modification Of Afm Probe Tipmentioning

confidence: 99%

“…On the other hand, AFM possesses in situ precise mechanical analysis capabilities and strong scalability that are not available in other morphological characterization tools. In addition to obtaining information such as material elasticity, hardness, and Hamaker constants, AFM can acquire the ability to characterize electrical and magnetic properties , by assembling different modules and probes. Moreover, utilizing probe modification techniques enables the attachment of individual organic molecules, particles, or cells onto AFM probes, thereby facilitating quantitative analysis of the interactions between different substances.…”

Section: Basic Introduction To Afmmentioning

confidence: 99%

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Applications of AFM in Membrane Characterization and Fouling Analysis

Liu,

Zhu,

Chen

et al. 2024

ACS EST Eng.

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Atomic force microscopy (AFM), as a type of scanning probe microscopy (SPM), possesses formidable capabilities for nanoscale imaging and force spectroscopy. Due to its advantages such as high resolution, nondestructive detection, minimal environmental restrictions, strong versatility, and real-time in situ analysis, AFM has become an indispensable tool in surface science and materials research, finding extensive applications in the study of the membrane separation and fouling processes. The tremendous advantages of AFM in characterization applications stem from its diverse tip functionalization techniques. This review encompasses the preparation of AFM probe tips and the modification techniques of special tips, including carbon nanotube (CNT) probes, metal nanowire probes, colloidal probes, and single-cell/molecule probes. Furthermore, it highlights the applications and advancements of AFM and probe modification techniques in membrane technology research. With the continuous development of tip modification techniques, the analytical capabilities of AFM will be further expanded, promising broader prospects for its application in the study of membrane fouling mechanisms and the development of antifouling membrane materials.

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Section: Preparation and Modification Of Afm Probe Tipmentioning

confidence: 99%

Section: Basic Introduction To Afmmentioning

confidence: 99%

Applications of AFM in Membrane Characterization and Fouling Analysis

Liu,

Zhu,

Chen

et al. 2024

ACS EST Eng.

View full text Add to dashboard Cite

show abstract

“…At the present stage of nanotechnology development, one of the most promising methods for surface diagnostics is scanning probe microscopy (SPM). The use of SPM methods allows the study of the local geometric, electrical, and mechanical properties of the sample surface [23][24][25][26].…”

Section: Introductionmentioning

confidence: 99%

Application of Probe Nanotechnologies for Memristor Structures Formation and Characterization

Smirnov¹,

Il’ina²,

Avilov³

et al. 2019

Memristors - Circuits and Applications of Memristor Devices [Working Title]

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This chapter presents the results of experimental studies of the formation and investigation of the memristors by probe nanotechnologies. This chapter also perspectives and possibilities of application of local anodic oxidation and scratching probe nanolithography for the manufacture of memristors based on titanium oxide structures, nanocrystalline ZnO thin film, and vertically aligned carbon nanotubes. Memristive properties of vertically aligned carbon nanotubes, titanium oxide, and ZnO nanostructures were investigated by scanning probe microscopy methods. It is shown that nanocrystalline ZnO films manifest a stable memristor effect slightly dependent on its morphology. Titanium oxide nanoscale structures of different thicknesses obtained by local anodic oxidation demonstrate a memristive effect without the need to perform any additional electroforming operations. This experimentally confirmed the memristive switching of a two-electrode structure based on a vertically aligned carbon nanotube. These results can be used in the development of designs and technological processes of resistive random access memory (ReRAM) units based on the memristor devices.

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Metal-insulator transition in V2O3 thin film caused by tip-induced strain

Alyabyeva

Sakai

Bavencoffe

et al. 2018

Applied Physics Letters

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We have demonstrated pressure-induced transition in a c-axis oriented V2O3 thin film from strongly correlated metal to Mott insulator in a submicrometric region by inducing a local stress using contact atomic force microscopy. To have an access to a pressure range of sub-gigapascal, a tip with a large radius of 335 nm was prepared by chemical vapour deposition of platinum onto a commercial tip with a focused ion beam (FIB). The FIB-modified tip gives a good electrical contact at low working pressures (0.25-0.4 GPa) allowing unambiguously to evidence reversible metalinsulator transition in a pulsed laser-deposited V2O3 thin film by means of local investigations of current-voltage characteristics. A finite element method has confirmed that the diminution of c/a ratio under this tip pressure explains the observed phase transition of the electron density of states in the film.

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Atomic Force Microscopy Measurement of the Resistivity of Semiconductors

Cited by 11 publications

References 17 publications

Applications of AFM in Membrane Characterization and Fouling Analysis

Applications of AFM in Membrane Characterization and Fouling Analysis

Application of Probe Nanotechnologies for Memristor Structures Formation and Characterization

Metal-insulator transition in V2O3 thin film caused by tip-induced strain

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