Atomic-force-microscope study of contact area and friction on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">NbSe</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>

Lantz, Mark A.; O’Shea, S. J.; Welland, Mark E.; Johnson, Kenneth L.

doi:10.1103/physrevb.55.10776

Cited by 243 publications

(168 citation statements)

References 21 publications

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“…The Maugis theory, experimentally verified by Lantz et al [251], shows that an exact determination of the Young's modulus E and of the work of adhesion W only from force-distance curves is impossible, because the slope of the contact line and the jump-off-contact depend on each other in a way described by the parameter l, but in order to calculate l both E and W must be known.…”

Section: Theory: Hertz Jkr Dmt and Beyondmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,198

2,949

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Section: Theory: Hertz Jkr Dmt and Beyondmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,198

2,949

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“…Carpick et al [5] found that friction was proportional to the contact area as described by the Johnson-Kendall-Roberts (JKR) model [6] for mica samples. Experiments by Lantz et al [7] on NbSe 2 and graphite resulted in a relation between friction and contact area described by the Maugis-Dugdale (MD) model [8]. These continuum mechanics models can, in principle, only be applied for isotropic materials, and corrections may be significant for layered materials [9].…”

Section: Atomic Force Microscopy Study Of An Ideally Hard Contactmentioning

confidence: 99%

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

et al. 1998

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A comprehensive nanotribological study of a hydrogen-terminated diamond(111)/tungsten carbide interface has been performed using ultrahigh vacuum atomic force microscopy. Both contact conductance, which is proportional to contact area, and friction have been measured as a function of applied load. We demonstrate for the first time that the load dependence of the contact area in UHV for this extremely hard single asperity contact is described by the Derjaguin-Müller-Toporov continuum mechanics model. Furthermore, the frictional force is found to be directly proportional to the contact area. Comments

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“…Numerous experimental characterizations of the physical properties of nanoscale contacts have been performed by means of nanoindentation, [1][2][3][4] atomic force microscopy [5][6][7][8] and scanning tunneling microscopy ͑STM͒. 9,10 More recently, it has become recognized that a probe tip-quartz crystal microbalance ͑QCM͒ [11][12][13][14][15][16][17][18][19][20] or closely related geometries 21 could also have enormous potential as a sensitive probe of interfacial physical properties.…”

Section: Introductionmentioning

confidence: 99%

Measuring nanomechanical properties of a dynamic contact using an indenter probe and quartz crystal microbalance

Borovsky

Krim

Asif

et al. 2001

Journal of Applied Physics

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A study of the contact mechanics of a probe tip interacting with a quartz crystal microbalance ͑QCM͒ has been performed, involving simultaneous measurements of normal load, displacement, and contact stiffness with changes in QCM resonant frequency. For metal-metal and glass-metal contacts in air, the QCM frequency shifts were observed to be positive, and directly proportional to the contact area as inferred from the contact stiffness. Interfacial characteristics of the probe-tip contact ͑elasticity, contact size, and an estimate of the number of contacting asperities͒ were deduced by extending a prior model of single asperity contact to the case of multiple contacts. The extended model clarifies a number of seemingly disparate experimental results that have been reported in the literature.

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Atomic-force-microscope study of contact area and friction onNbSe2

Cited by 243 publications

References 21 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

Measuring nanomechanical properties of a dynamic contact using an indenter probe and quartz crystal microbalance

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