Atomic force microscope–force mapping and profiling on a sub 100-Å scale

Martin, Yves; Williams, C. C.; Wickramasinghe, H. K.

doi:10.1063/1.338807

Cited by 1,320 publications

(634 citation statements)

References 6 publications

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“…EFM [20][21][22][23][24][25][26][27] simultaneously measures surface topography and the electrostatic force gradients above the surface. A conductive probe is electrically connected to the conducting substrate.…”

Section: Methodsmentioning

confidence: 99%

Electric Fields on Oxidized Silicon Surfaces: Static Polarization of PbSe Nanocrystals

Ben-Porat¹,

Cherniavskaya²,

Brus³

et al. 2004

J. Phys. Chem. A

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By use of electrostatic force microscopy, we measure the charge and polarizability of 12-nm PbSe nanocrystals on n-and p-type silicon with a 2-nm thermal oxide layer. Individual nanocrystals show a dielectric constant of >100. In ambient light, the nanocrystals generate static electric fields of magnitudes too weak to be caused by a full elementary charge. These nanocrystals are statically polarized by surface electric fields generated by fixed charges in the oxide substrate. We model this effect quantitatively and assign charge locations in the oxide. Upon 442-nm photoexcitation, we observe some of the nanocrystals (∼35%) photoionize and slowly relax overnight back to their initial states. Just above a charge in the oxide, the surface electric field can approach 10 8 V/cm.

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Section: Methodsmentioning

confidence: 99%

Electric Fields on Oxidized Silicon Surfaces: Static Polarization of PbSe Nanocrystals

Ben-Porat¹,

Cherniavskaya²,

Brus³

et al. 2004

J. Phys. Chem. A

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“…The shift is determined by the gradient of the force. Vice versa, from the measured shift of the resonance frequency the force gradient can be calculated [11].…”

Section: Dynamic Force Measurementsmentioning

confidence: 99%

“…This stimulated the measurement of magnetic [7][8][9][10] and electrostatic forces [11][12][13] and led to the development of magnetic force, electric force, and Kelvin probe microscopy [14]. The goal was not so much to understand the force but to image the distribution of magnetization, charge, or surface potential, respectively.…”

Section: Introductionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,198

2,949

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“…The excitation method using a piezoelectric actuator has been most commonly used [35]. However, the amplitude and phase versus frequency curves obtained by this method show large distortions due to the vibrations at the spurious resonances in the cantilever and sample holders.…”

Section: Instability Of Cantilever Excitationmentioning

confidence: 99%

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

et al. 2012

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Abstract. In this study, we have investigated the performance of liquid-environment FM-AFM with various cantilevers having different dimensions from theoretical and experimental aspects. The results show that the reduction of the cantilever dimensions provides improvement in the minimum detectable force as long as the tip height is sufficiently long compared with the width of the cantilever. However, we also found two important issues to be overcome to achieve this theoretically-expected performance. The stable photothermal excitation of a small cantilever requires much higher pointing stability of an excitation laser beam than that for a long cantilever. We present a way to satisfy this stringent requirement using a temperature controlled laser diode module and a polarization-maintaining optical fiber. Another issue is associated with the tip. While a small carbon tip formed by electron beam deposition (EBD) is desirable for small cantilevers, we found that an EBD tip is not suitable for atomic-scale applications due to the weak tip-sample interaction. Here we present that the tip-sample interaction can be greatly enhanced by coating the tip with Si. With these improvements, we demonstrate atomic-resolution imaging of mica in liquid using a small cantilever with a megahertz-order resonance frequency. In addition, we experimentally demonstrate the improvement in the minimum detectable force obtained by the small cantilever in the measurements of oscillatory hydration forces.

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Atomic force microscope–force mapping and profiling on a sub 100-Å scale

Cited by 1,320 publications

References 6 publications

Electric Fields on Oxidized Silicon Surfaces: Static Polarization of PbSe Nanocrystals

Electric Fields on Oxidized Silicon Surfaces: Static Polarization of PbSe Nanocrystals

Force measurements with the atomic force microscope: Technique, interpretation and applications

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

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