Atomic Force Microscope

Binnig, G.; Quate, C. F.; Gerber, Ch.

doi:10.1007/978-94-011-1812-5_4

Cited by 520 publications

(586 citation statements)

References 11 publications

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“…The atomic force microscope (AFM), invented by Binnig, Quate and Gerber [1], has become an important tool for imaging the topography of surfaces with high resolution. Soon after the invention of the AFM it was realised that it can also be used for force-versus-distance measurements [2,3].…”

Section: Introductionmentioning

confidence: 99%

The Colloidal Probe Technique and its Application to Adhesion Force Measurements

Kappl¹,

Butt²

2002

Part. Part. Syst. Charact.

226

135

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Section: Introductionmentioning

confidence: 99%

The Colloidal Probe Technique and its Application to Adhesion Force Measurements

Kappl¹,

Butt²

2002

Part. Part. Syst. Charact.

226

135

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“…AFM has a resolution similar to that of STM, but it's use is not limited to conductive surfaces [49]. Measurement using an AFM is performed with a sharp probe that collects a series of line scans across the surface of a part.…”

Section: Scanning Probe Microscopymentioning

confidence: 99%

Metrology, Inspection, and Process Control in Micro‐Scales

Karhade

2011

Micro‐Manufacturing

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“…AFM, which was invented in 1986, expanded the application of scanning tunneling microscopy to nonconductive, soft, and living biological samples [85][86][87][88]. AFM has several capabilities, including imaging topographic details of surfaces from the submolecular level to the cellular level [89], monitoring the dynamic processes of single molecules in physiologically relevant solutions [90], measuring molecular interactions [91], and characterizing the mechanical properties of single molecules or single nanostructures [92].…”

Section: Atomic Force Microscopymentioning

confidence: 99%