Assessment of nondiamond carbon levels present in chemical vapor deposited diamond by analysis of the plasmon loss features of x-ray photoelectron spectra

Haq, Sajad; Tunnicliffe, D.L.; Sails, Stephanie R.; Savage, J. A.

doi:10.1063/1.116416

Cited by 10 publications

(8 citation statements)

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“…Haq et al proposed a figure of merit ͑FOM͒ from the XPS data which is the ratio of the integrated peak areas of the C 1s peak to the diamond bulk plasmon peak. 14 The higher the FOM, the worse the diamond quality. Figure 5 shows the FOM of the six samples as a function of sample color.…”

Section: Xps Resultsmentioning

confidence: 99%

“…14 The C 1s binding energies for pure carbon phases are only slightly affected by the hybridization of the atoms, making it very difficult to differentiate diamond/ nondiamond content in CVD diamond films by looking at the C 1s peak. 15 Moreover, surface contamination and charging effects cause additional problems.…”

Section: Introductionmentioning

confidence: 99%

“…Graphite, amorphous carbon, and diamond show characteristic energy loss features at the higher binding energy side of the C 1s peak. [14][15][16] The ratio of the integrated areas of the diamond bulk plasmon peak to the C 1s peak has been proposed to yield the ratio of diamond to total carbon present. 14 In carbon, the valence band arises primarily from 2s and 2 p hybridization.…”

Section: Introductionmentioning

confidence: 99%

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Comparison of infrared, Raman, photoluminescence, and x-ray photoelectron spectroscopy for characterizing arc-jet-deposited diamond films

Haque

Naseem

Shultz

et al. 1998

Journal of Applied Physics

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Impurities and growth-related defect structures are mainly responsible for low thermal conductivity of chemical vapor deposited diamond films. Different quality arc-jet-deposited, free-standing diamond samples were obtained from industry. Fourier transform infrared ͑FTIR͒, Raman, and x-ray photoelectron spectroscopy ͑XPS͒ were used to determine the quality of these samples. The nondiamond carbon was estimated from the 1560 cm Ϫ1 broad peak intensity, the CH x integrated peak absorbance, and the C 1s plasmon loss features for Raman, FTIR, and XPS studies, respectively. The diamond quality was also determined from the Raman diamond peak full width at half maximum ͑FWHM͒ and XPS valence band spectra. It was observed that the higher the hydrogen content ͑determined by FTIR͒, the darker the color of the film, the larger the nondiamond 1560 cm Ϫ1 peak intensity, and the larger the FWHM of the Raman diamond peak at 1332 cm Ϫ1 . Negligible difference in the C 1s diamond bulk plasmon loss peak was observed for films of wide ranging quality. The FTIR CH x band exhibited the highest sensitivity to film quality. Impurity-related peaks were observed in the one phonon region of the FTIR spectra and the photoluminescence spectra. The photoluminescence background peak centered at 2.0 eV was found to be strongly related to nondiamond carbon impurities. It is shown that a combination of different analytical tools is required to determine diamond quality.

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Section: Xps Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Comparison of infrared, Raman, photoluminescence, and x-ray photoelectron spectroscopy for characterizing arc-jet-deposited diamond films

Haque

Naseem

Shultz

et al. 1998

Journal of Applied Physics

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“…Energy loss spectroscopy of photoelectrons emitted from the C1s core level has been used previously either for investigations of the role of surface hydrogen and oxygen atom coverage [11,12] as well as for the study of seeding and growth of nano-and microcrystalline diamond films [16][17][18][19]. For the assessment of the non diamond residual phase, the ratio of the bulk ( + ) plasmon loss of the diamond phase to the main C1s line (characteristic of the near-surface over typically 5 nm) was tentatively correlated to the ratio of G and D lines in Raman spectra (characteristic of a bulk depth >100 nm) [17].…”

Section: Introductionmentioning

confidence: 99%

“…For the assessment of the non diamond residual phase, the ratio of the bulk ( + ) plasmon loss of the diamond phase to the main C1s line (characteristic of the near-surface over typically 5 nm) was tentatively correlated to the ratio of G and D lines in Raman spectra (characteristic of a bulk depth >100 nm) [17].…”

Section: Introductionmentioning

confidence: 99%

Sensitivity of photoelectron energy loss spectroscopy to surface reconstruction of microcrystalline diamond films

David

Pinault-Thaury

Ballutaud

et al. 2013

Applied Surface Science

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International audienceIn X-ray Photoelectron Spectroscopy (XPS), binding energies and intensities of core level peaks are commonly used for chemical analysis of solid surfaces, after subtraction of a background signal. This background due to photoelectron energy losses to electronic excitations in the solid (surface and bulk plasmon excitation, inter band transitions) contains valuable information related to the near surface dielectric function ε(ħω). In this work, the sensitivity of Photoelectron Energy Loss Spectroscopy (PEELS) is investigated using a model system, namely the well-controlled surface reconstruction of diamond. Boron-doped microcrystalline thin films with a mixture of (1 1 1) and (1 0 0) preferential orientations were characterized in the as-grown state, with a partially hydrogenated surface, and after annealing at 1150 °C in ultra high vacuum. After annealing, the bulk (σ + π) plasmon of diamond at 34.5 eV is weakly attenuated but no evidence for surface graphitization is observed near 6 eV, as confirmed by electronic properties. Unexpected features which appear at 10 ± 1 eV and 19 ± 1 eV in the energy loss distribution are well described by simulation of surface plasmon excitations in graphite-like materials; alternatively, they also coincide with experimental inter band transition losses in some graphene layers. This comparative study shows that the PEELS technique gives a clear signature of weak effects in the diamond surface reconstruction, even in the absence of graphitization. It confirms the sensitivity of PEELS acquisition with standard XPS equipment as a complementary tool for surface analysis

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Measurement of the relative abundance of sp2 and sp3 hybridised atoms in carbon-based materials by XPS: a critical approach. Part II

Speranza

Laidani

2004

Diamond and Related Materials

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Assessment of nondiamond carbon levels present in chemical vapor deposited diamond by analysis of the plasmon loss features of x-ray photoelectron spectra

Cited by 10 publications

References 0 publications

Comparison of infrared, Raman, photoluminescence, and x-ray photoelectron spectroscopy for characterizing arc-jet-deposited diamond films

Comparison of infrared, Raman, photoluminescence, and x-ray photoelectron spectroscopy for characterizing arc-jet-deposited diamond films

Sensitivity of photoelectron energy loss spectroscopy to surface reconstruction of microcrystalline diamond films

Measurement of the relative abundance of sp2 and sp3 hybridised atoms in carbon-based materials by XPS: a critical approach. Part II

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