2018
DOI: 10.1016/j.scriptamat.2017.03.034
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Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography

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Cited by 39 publications
(62 citation statements)
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“…APT has the capability of chemically characterizing materials in 3D on an atom‐by‐atom basis, which helps to understand the formation of nanostructures in metals and semiconductors. The technique has been applied to detect off‐stoichiometry around the grain boundaries in various semiconductors such as silicon, chalcogenides, filled skutterdites, zintls, oxides, and other systems . The results suggest that the resistance of the grain boundaries in Mg 3 Sb 2 ‐based materials can be attributed to a Mg deficiency that greatly reduces the local free charge carrier concentration.…”
Section: Introductionsupporting
confidence: 89%
“…APT has the capability of chemically characterizing materials in 3D on an atom‐by‐atom basis, which helps to understand the formation of nanostructures in metals and semiconductors. The technique has been applied to detect off‐stoichiometry around the grain boundaries in various semiconductors such as silicon, chalcogenides, filled skutterdites, zintls, oxides, and other systems . The results suggest that the resistance of the grain boundaries in Mg 3 Sb 2 ‐based materials can be attributed to a Mg deficiency that greatly reduces the local free charge carrier concentration.…”
Section: Introductionsupporting
confidence: 89%
“…This technique is frequently employed to characterize the elemental distribution in solids on the nanoscale. [ 25,26 ] In atom probe tomography, a voltage is applied to a sharp tip of a specimen creating a high field strength at the apex of the tip (see Figure ). In samples which are nonconducting, in addition, a short laser pulse is applied to dislodge atomic or molecular fragments from the surface.…”
Section: Introducing a New Bonding Mechanism: Metavalent Bondingmentioning
confidence: 99%
“…The last hypothesis possibly at the origin of the dominant recombination mechanism could be the absence of oxygen near the CIGSe/C24 interface. Indeed, in most of the best devices reported in the literature, oxygen is detected at the absorber/buffer physical junction, but also at grain boundaries (GBs) . The optoelectronic role played by the oxygen is nonetheless rather difficult to evaluate since it can either be substituted to Se, bonded to alkali, or as − OH; however, it has been shown that annealing the cells in ambient atmosphere frequently improves and never degrades the V oc and FF of the solar cells.…”
Section: Discussionmentioning
confidence: 99%
“…The optoelectronic role played by the oxygen is nonetheless rather difficult to evaluate since it can either be substituted to Se, bonded to alkali, or as − OH; however, it has been shown that annealing the cells in ambient atmosphere frequently improves and never degrades the V oc and FF of the solar cells. The model proposed is that O passivates some detrimental point defects . So far, this hypothesis is probably the most realistic because it also implies the specificities of the S‐based co‐evaporation process, and would be an explanation for the absorber bulk modification through O‐free GBs.…”
Section: Discussionmentioning
confidence: 99%