Assessing the quality of scanning probe microscope designs

Thompson, James B.; Drake, B.; Kindt, Johannes H.; Hoskins, Jessica; Hansma, Paul K.

doi:10.1088/0957-4484/12/3/331

Cited by 14 publications

(6 citation statements)

References 27 publications

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“…On the other hand, the sources of displacement noise in AFM are usually not of fundamental interest because they relate to instrument design and AFM engineering [28]. Nevertheless, their existence should not be disregarded: vibrations between the tip and the sample can have profound impact on the results of an AFM experiment, even if they lie outside of the measurement bandwidth.…”

Section: Overview Of Stochastic Noise In Afmmentioning

confidence: 99%

Stochastic noise in atomic force microscopy

et al. 2012

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Having reached the quantum and thermodynamic limits of detection, atomic force microscopy (AFM) experiments are routinely being performed at the fundamental limit of signal to noise. A critical understanding of the statistical properties of noise leads to more accurate interpretation of data, optimization of experimental protocols, advancements in instrumentation, and new measurement techniques. Furthermore, accurate simulation of cantilever dynamics requires knowledge of stochastic behavior of the system, as stochastic noise may exceed the deterministic signals of interest, and even dominate the outcome of an experiment. In this article, the power spectral density (PSD), used to quantify stationary stochastic processes, is introduced in the context of a thorough noise analysis of the light source used to detect cantilever deflections. The statistical properties of PSDs are then outlined for various stationary, nonstationary, and deterministic noise sources in the context of AFM experiments. Following these developments, a method for integrating PSDs to provide an accurate standard deviation of linear measurements is described. Lastly, a method for simulating stochastic Gaussian noise from any arbitrary power spectral density is presented. The result demonstrates that mechanical vibrations of the AFM can cause a logarithmic velocity dependence of friction and induce multiple slip events in the atomic stick-slip process, as well as predicts an artifactual temperature dependence of friction measured by AFM.

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Section: Overview Of Stochastic Noise In Afmmentioning

confidence: 99%

Stochastic noise in atomic force microscopy

et al. 2012

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“…In such cases, a very accurate measurement can be realized. 9 Therefore, since a harder force probe gives a higher resonant frequency and a higher quality factor in a liquid environment, its thermal noise level can be as low as that of softer probes.…”

Section: B Thermal Fluctuation Of Force Probementioning

confidence: 99%

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

Takeuchi

Miyakoshi

Taninaka

et al. 2006

Journal of Applied Physics

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The accuracy of dynamic-force spectroscopy ͑DFS͒, a promising technique of analyzing the energy landscape of noncovalent molecular bonds, was reconsidered in order to justify the use of an atomic-force microscopy ͑AFM͒ cantilever as a DFS force probe. The advantages and disadvantages caused, for example, by the force-probe hardness were clarified, revealing the pivotal role of the molecular linkage between the force probe and the molecular bonds. It was shown that the feedback control of the loading rate of tensile force enables us a precise DFS measurement using an AFM cantilever as the force probe.

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“…This instrumental noise, although being often neglected once a successful measurement has been achieved, will be shown to have significant influence on the measured velocity-dependent friction behavior. Examples explicitly showing the influence of mechanical vibrations include the formation of unstable tip-sample contacts [20] and can result in unintended oscillations of the cantilever (also possibly resulting in an unstable tip-sample contact) [21], a transition to the low friction regime of dynamic superlubricity [22], and a significant reduction in wear of AFM probes [23]. Similar to thermal noise, mechanical noise can suppress atomic friction through activating motion at the contact [6,24,25].…”

Section: Introductionmentioning

confidence: 99%

Reinterpretation of velocity-dependent atomic friction: Influence of the inherent instrumental noise in friction force microscopes

et al. 2014

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We have applied both the master equation method and harmonic transition state theory to interpret the velocity-dependent friction behavior observed in atomic friction experiments. To understand the discrepancy between attempt frequencies measured in atomic force microscopy experiments and those estimated by theoretical models, both thermal noise and instrumental noise are introduced into the model. It is found that the experimentally observed low attempt frequency and the transition point at low velocity regimes can be interpreted in terms of the instrumental noise inherent in atomic force microscopy. In contrast to previous models, this model also predicts (1) the existence of a two-slope curve of velocity dependence and (2) the decrease of critical velocity with temperature, which provides clues for further experimental verification of the influence of instrumental noise in friction measurements.

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Assessing the quality of scanning probe microscope designs

Cited by 14 publications

References 27 publications

Stochastic noise in atomic force microscopy

Stochastic noise in atomic force microscopy

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

Reinterpretation of velocity-dependent atomic friction: Influence of the inherent instrumental noise in friction force microscopes

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