2017
DOI: 10.1016/j.addma.2016.10.004
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Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture

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Cited by 42 publications
(17 citation statements)
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“…In recent years, much research has been going in this direction. The online analysis outlined assumes that non-destructive evaluation (NDE) measurements can be conducted during the manufacturing process and process measurement data on-the-fly, reducing the bottleneck apparent in the layer completion time [71]. Figure 6 depicts a flowchart of the necessary steps that have been discussed above for the realization of components that can be qualified by an industry that use PBF processes.…”
Section: Post-processingmentioning
confidence: 99%
“…In recent years, much research has been going in this direction. The online analysis outlined assumes that non-destructive evaluation (NDE) measurements can be conducted during the manufacturing process and process measurement data on-the-fly, reducing the bottleneck apparent in the layer completion time [71]. Figure 6 depicts a flowchart of the necessary steps that have been discussed above for the realization of components that can be qualified by an industry that use PBF processes.…”
Section: Post-processingmentioning
confidence: 99%
“…Methods that have been developed or adapted for use with SLM/DMLS can be categorized as shown in Figure 9. Craeghs et al [97][98][99][100], Kleszczynski et al [118], Clijsters et al [119], Chivel [120], Grasso et al [121], Hirsh et al [122], Kanko et al [123], and Lott et al [124]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [125] and Smurov et al [126].…”
Section: Experiments Developmentmentioning
confidence: 99%
“…Optical methods are the easiest to use during experimentation, as they are usually non-disruptive to the process and can be applied externally without modifying the process or equipment. A number of excellent optimal monitoring systems has been developed, in particular those by Craeghs et al [98][99][100][101], Kleszczynski et al [119], Clijsters et al [120], Chivel [121], Grasso et al [122], Hirsh et al [123], Kanko et al [124] and Lott et al [125]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [126] and Smurov et al [127].…”
Section: Optical Process Monitoringmentioning
confidence: 99%