2010
DOI: 10.1002/adma.201000599
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Artificial Single Variant Martensite in Freestanding Fe70Pd30Films Obtained by Coherent Epitaxial Growth

Abstract: The mechanically soft behavior of the magnetic shape‐memory material Fe70Pd30 allows huge tetragonal distortions to be stabilized in sputtered thin films by coherent epitaxial growth on various metallic buffers. Furthermore, it is demonstrated that epitaxial films more than 1 µm thick can be grown, which makes possible freestanding films in an artificial single variant state suitable for microactuators and sensors.

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Cited by 20 publications
(16 citation statements)
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“…The substrate defines different in-plane lattice constants, which allowed varying the tetragonal distortion within the Bain transformation path. In the thickness range from 50 nm up to 2 µm no relaxation was observed [8]. In the present work, we introduce Cu as a new substrate, which induces a tetragonal distortion of c/a = 1.09 within the Fe 70 Pd 30 filma value well beyond the Bain transformation path.…”
mentioning
confidence: 89%
“…The substrate defines different in-plane lattice constants, which allowed varying the tetragonal distortion within the Bain transformation path. In the thickness range from 50 nm up to 2 µm no relaxation was observed [8]. In the present work, we introduce Cu as a new substrate, which induces a tetragonal distortion of c/a = 1.09 within the Fe 70 Pd 30 filma value well beyond the Bain transformation path.…”
mentioning
confidence: 89%
“…This type of application also requires a high K and benefits from high J S and T C . In contrast to MSM microactuators, which require a release from the substrate [12] this is not necessary for recording applications. This paper is arranged as follows: After a short description of sample preparation and methods used for analysis we characterise in detail the structure of the epitaxial films.…”
mentioning
confidence: 99%
“…This reduces the driving force for the transformation and all associated relaxation processes and is thus favourable for strained epitaxial growth. Indeed, to avoid unfavourable relaxation mechanism like (111) fcc deformation twinning[37], very low deposition rates of 0.024 nm s -1 were required for epitaxial growth of binary Fe 70 Pd 30 films[12]. The present Fe-Pd-Cu films, however, were grown with a deposition rate one order of magnitude higher (0.3 nm s -1 ).…”
mentioning
confidence: 99%
“…Close to this bcc ground state, Fe 70 Pd 30 films on Au buffer grow epitaxial up to a thickness of 1.2 µm [31]. In case of this Au buffer, no bcc-type twinning was observed.…”
Section: Bcc Deformation/growth Twinsmentioning
confidence: 99%