Approximate parametric fault diagnosis

Kincl, Zdenek; Kolka, Zdenek

doi:10.1109/radioelek.2011.5936449

Cited by 7 publications

(2 citation statements)

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“…The proposed method will be demonstrated on a test frequency selection for the analysis of an EMI filter [10], which is generally used for the reduction of electromagnetic interference in electronic power transmission lines. The basic electrical model of a real EMI filter is shown in Fig.…”

Section: Application Examplementioning

confidence: 99%

Parametric fault diagnosis using overdetermined system of fault equations

Kincl

Kolka

2011

2011 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS 2011)

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The paper shows a procedure for testing linear analog circuits using multi-frequency parametric fault diagnosis. Some methods for test frequency selection determine the total number of test frequencies equal to the total number of tested network parameters. The error between actual and estimated network parameters is evaluated only on several frequencies while the rest of the frequency band of the circuit is not taken into account. A new approach based on an overdetermined system of fault equations which can dramatically reduce the total error of the solution is presented. A practical example of application is shown on the test frequency selection of an EMI filter.

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Section: Application Examplementioning

confidence: 99%

Parametric fault diagnosis using overdetermined system of fault equations

Kincl

Kolka

2011

2011 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS 2011)

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“…No matter what kind of techniques, such as the symbolic techniques [52], [56], transfer function coefficients estimation methods [57], [58], approximated transfer function coefficients estimation [59], [60] and inverse problem-based method [60] are adopted, the transfer function of the CUT is required.…”

Section: Introductionmentioning

confidence: 99%

Complex Field Fault Modeling-Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis

Yang

Liu

et al. 2014

IEEE Trans. Instrum. Meas.

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Owing to the lack of feasible fault modeling method, hard (open and short) faults, and discretized parametric faults are still the mostly used fault models. These models cannot characterize all soft (parameter shifting) faults because that the parameter of analog element be of continuity character. To address this concern, a complex field fault modeling method is presented first. If fault happens to passive element x i in linear analog circuit, the real (U r ) and imaginary (U j ) parts of faulty voltage phasor U°(U°= U r + j U j ) must satisfy binary quadratic function F i (U r , U j ) = 0, which is independent from the value of element x i and uniquely determined by its location and the nominal circuit under test. Hence, the binary quadratic function can model any continuous parameter shifting (soft) or hard fault. Second, to avoid calculating the explicit expression of binary quadratic function, a simulation-based method is given to obtain the locus of the change in the function F z in the complex plane. Besides, the nominal (fault-free) point, the loci determined by the binary quadratic functions might intersect with each other. It is referred to as aliasing problem in this paper. This problem can be solved by adjusting the frequency of the input signal. Therefore, a constraint optimization method is proposed to select optimal test frequencies. The proposed test generation and compression methods, when combined with the complex field modeling method, can pinpoint much more fault components with less test points and frequencies when compared with the other methods.

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