Approaches of voltage divider development for metrology verification of ADC

Adv. Sci. Technol. Res. J.

et al. 2016

Self Cite

The authors offer to solve the problem of providing traceability of measurements by increasing metrological autonomy of in-plant measuring systems. The paper shows the expedience of increasing metrological autonomy by creating a "virtual" reference. There are analysed possible variants of implementation of the "virtual" reference, which will provide high metrological stability of measurements at insignificant additional expenses. The authors point out the necessity of creation of universal technical and programmatic means of mutual comparison for the in-plant measuring systems to increase the reliability of measurements in the conditions of metrological autonomy.

Section: Research Objectivesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Increasing Metrological Autonomy of in-Plant Measuring Systems

Mykyychuk¹,

Adv. Sci. Technol. Res. J.

et al. 2016

Self Cite

“…An analysis of the influence of the tested ADC on the residual error [6] shows the potential of this implementation method for an ADC with a smooth conversion characteristic.…”

Section: Approach Of Testing Points Generationmentioning

confidence: 99%

“…So correction of the ADC's integral nonlinearity provides a higher accuracy of the measurement results. In [6] a method for the identification of the ADC's integral nonlinearity in the set of testing points conventionally called as basic method was proposed. This method provides the generation of a set of testing points, which correspond to the number sequence…”

Section: Introductionmentioning

confidence: 99%

Method of integral nonlinearity testing and correction of multi-range ADC by direct measurement of output voltages of multi-resistors divider

Zhengbing¹,

et al. 2015

ACTA IMEKO

Self Cite

A method of testing points generation for the identification and correction of the integral nonlinearity of high performance ADCâ€™s is presented. The proposed method is based on averaging all voltages of the multi-resistor voltage divider. The influence of the resistors errors and random errors of the ADC on the residual error of the integral nonlinearity correction for method based on multi-resistor divider is investigated.

“…They provide precision identification of ADC's CF in the set of testing points [8]. The number of generated testing points is beginning from one up to some dozen per range depending on the complexity of the circuit and processing algorithm.…”

mentioning

confidence: 99%

Integral Nonlinearity of Second-Order Single-Bit Sigma-Delta Modulator

Sun¹,

et al. 2016

Teh. Elektrodin.

The simulation model of single-bit second-order sigma-delta modulator and analog-to-digital converter (ADC) based on this modulator is developed. The study of influence of all components parameters on integral nonlinearity of ADC isIntroduction. Wide implementation of processors and digital signal processing algorithms in data acquisition and measurement systems brings to that analog-to-digital converters (ADC) became the necessary component of such systems. The metrology characteristics of systems of electrical quantities measurement are mainly defined by metrology characteristics of used ADCs. Therefore, improvement of metrology characteristics of ADCs is an actual task and it can give improvement of the accuracy of measurement results.The segment of precision ADC is filled by the converters based on sigma-delta modulators (SDM). Such ADCs are in the line of leading companies and are very popular on the market [1,2]. Their high accuracy is based on implementation of accuracy improvement methods -null setting and calibration using reference voltage source. These methods provide correction of additive and multiplicative components of ADC's error. The residual error of such ADC is mainly defined by nonlinearity of ADC's conversion function (CF). Its level is significant and potentially we can decrease it. For example, 24-bit ADC of AD7714 type has integral nonlinearity not more than 15 ppm [3], and it corresponds only to 16-th bit. At the same time its effective resolution is up to 22 bit. So the nonlinearity of CF is 6 low signed "effective" bits or 8 least significant bits -LSB (taking into consideration noise level). Decreasing of ADC's nonlinearity provides smoothing of ADC's CF and can provide design accurate model of measured object [4,5] or process [6,7]. Therefore it is actual to investigate the form of ADC's nonlinearity.The complexity of ADC's nonlinearity correction is associated with its dualistic character: nonlinearity is systematic for each ADC and random for the set of single type ADC. Besides the parameters of nonlinearity approximation function depend of the operation mode of ADC. Therefore, the single determination of this function, for example, after manufacturing, and further correction do not provide significant accuracy improvement of conversion results.The set of methods is developed. They provide precision identification of ADC's CF in the set of testing points [8]. The number of generated testing points is beginning from one up to some dozen per range depending on the complexity of the circuit and processing algorithm. However the implementation of these methods for correction of nonlinear error of ADC demands forming of interpolation curve for whole range. The interpolation function selection demands investigation of its character. The nonlinearity of sigma-delta ADC's CF is defined by nonlinearity of forward signal channel [9,10] and the purposeful selecting of interpolation function for nonlinearity correction demands study of the influence of integrator nonlinearity on nonlinearity o...