Method of integral nonlinearity testing and correction of multi-range ADC by direct measurement of output voltages of multi-resistors divider

Abstract

A method of testing points generation for the identification and correction of the integral nonlinearity of high performance ADC’s is presented. The proposed method is based on averaging all voltages of the multi-resistor voltage divider. The influence of the resistors errors and random errors of the ADC on the residual error of the integral nonlinearity correction for method based on multi-resistor divider is investigated.