Applications of the Near-Field Techniques in EMC Investigations

Baudry, David; Arcambal, Christian; Louis, Anne; Mazari, B.; Eudeline, Philippe

doi:10.1109/temc.2007.902194

Cited by 210 publications

(92 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…5(b). Those maps were realized with the NF scanning technique by using a metallic dipole loop as reported in [15,16].…”

Section: Experimental Analyses With Active Pcb Nf Emission In the Frementioning

confidence: 99%

“…Nevertheless, those techniques are still limited to the regular shape of scanning surface. The existing techniques are notably valid in function of the targeted 3D zones of interest in the proximity of the device under test in addition the measurement accuracy and the operating radio frequency (RF) bands [16].…”

Section: Introductionmentioning

confidence: 99%

“…However, on the one hand, the popular full wave simulation tools as CST [18], EMPro [19], HFSS [20], EMCoS [21] and FEKO [22] which are especially dedicated to the EM computations are not appropriate to the PCBs with typically complex structures and containing several integrated circuits. On the other hand, the EM NF scanning techniques [5,6,[14][15][16] are still very expensive and time consuming. Furthermore, the associated NF radiation processing methods are hardly practical for predicting EM emission in the 3D zones located nearby the radiating devices [23].…”

Section: Introductionmentioning

confidence: 99%

“…Furthermore, the associated NF radiation processing methods are hardly practical for predicting EM emission in the 3D zones located nearby the radiating devices [23]. Different from the EM far-field radiation analyses, the evanescent and non-uniform waves are of crucial importance when the NF emission interacts with a sensitive electronic circuit [1,2,16].…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Ravelo¹

2015

PIER M

View full text Add to dashboard Cite

Abstract-This paper deals with a fast and simple computational method of 3D near-field (NF) radiation from 2D planar frequency-and time-dependent data. The established calculation method can be used to predict the electromagnetic (EM) emission from various types of electronic devices. The proposed method is originally applicable to the computation of the EM NF along the arbitrary shaped curvilinear 3D surface of multi-shape objects. The EM computation consists in the application of the planar NF-to-NF transform using plane wave spectrum. The relevance of the established method is verified with three different validation tests of analytical and practical demonstrations. The first validation is based on the analytical NF radiation from set of elementary dipoles excited by a harmonic signal. The second validation test is based on the experimented data from a hybrid active printed circuit boards (PCBs) in the frequency domain. The last validation test is performed with the measured NF data from a microstrip planar circuit in the time-domain. For all the different test cases, the plots of EM NF on arbitrary curvilinear surfaces are presented. Applications with 3D visualization or holographic surface with arbitrary geometry of EM radiation from planar data in both frequency-and time-domains confirm the effectiveness of the proposed method to predict the EM NF emission from complex PCBs. The developed 2D-to-3D computational method is particularly useful for radiated EM compatibility engineering.

show abstract

“…5(b). Those maps were realized with the NF scanning technique by using a metallic dipole loop as reported in [15,16].…”

Section: Experimental Analyses With Active Pcb Nf Emission In the Frementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Ravelo¹

2015

PIER M

View full text Add to dashboard Cite

show abstract

“…Measuring electric or magnetic field emitted by microelectronic components is a part of EMC research and near field modeling [2][3][4]. Equivalent sources for electromagnetic circuits diagnostics and characterization can also be used to predict the field radiated by the device under test.…”

Section: Introductionmentioning

confidence: 99%

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

David¹,

Baudry²,

Louis³

2012

PIER B

Self Cite

View full text Add to dashboard Cite

Abstract-In this paper, two different kinds of near-field measurement techniques are presented. The first one uses coaxial probes that do not give precise measurements on microelectronic devices. We saw in [1] that the spatial resolution of these probes reaches 500 µm for monopole and is millimetric for dipole probe. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. Our objective is to improve the E x /E y near-field measurement with this second technique. The performance of the electro-optic (EO) probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements, on a wire above a ground plane and on coupled microstrip lines. At the end, a discussion about the technical limitations of the EO probe is made.

show abstract

A miniature shielded‐loop active H‐field probe design with high spatial resolution for near‐field measurement

Tang

Liu

et al. 2021

Int J RF Microw Comput Aided Eng

View full text Add to dashboard Cite

A miniature practical active magnetic field (H-field) probe with 0.5 mm Â 0.15 mm loop size is designed for electromagnetic interference analysis in electronic systems from 150 kHz to 12 GHz. This probe is fabricated in a four-layer printed circuit board using high-performance and low-loss Rogers material (RO4350B). A low noise amplifier with 14 dB-gain is applied to amplify the radio frequency detect signal. The spatial resolution of the proposed probe is verified under the microstrip with different widths (1.55 and 0.24 mm). In addition, the verification results indicate that the proposed small loop active shielded H-field probe can obtain the better spatial resolution of 422 μm with liftoff = 100 μm. Regarding to the sensitivity of the probe, the proposed probe realizes 16.7 dB μA at 3 GHz with the liftoff = 100 μm. compared with other commercial probes and a reference probe, the proposed probe has better spatial resolution at 150 kHz-12 GHz and sensitivity at 1.5-12 GHz.

show abstract

Applications of the Near-Field Techniques in EMC Investigations

Cited by 210 publications

References 11 publications

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Radiated Near-Field Emission Extraction on 3d Curvilinear Surfaces From 2d Data

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

A miniature shielded‐loop active H‐field probe design with high spatial resolution for near‐field measurement

Contact Info

Product

Resources

About