2004
DOI: 10.1088/0022-3727/37/8/002
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Application of the high-pressure thermoelectric technique for characterization of semiconductor microsamples: PbX-based compounds

Abstract: In this paper the technique of thermoelectric measurements at high pressure was applied for characterization of semiconductor microsamples based on lead chalcogenide compounds (p-PbSe, n-Pb 1−x Sn x Se). The Raman scattering technique at ambient pressure was used as an alternative tool for testing of the samples. Raman measurements have revealed broad peaks at 135 and 265 cm −1 for PbSe and Pb 1−x Sn x Se. Analogous spectra were obtained for PbS, and PbTe-based ternary compounds at higher and lower frequencies… Show more

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Cited by 54 publications
(33 citation statements)
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References 37 publications
(32 reference statements)
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“…Sn dopant was reported to decrease the transition pressure from 4.5 to 3 GPa. 10,20) Our high-pressure x-ray diffraction study of Pb 0.875 Sn 0.125 Se could assign the orthorhombic phase neither to GeS type nor to the Pnma; 21) nevertheless, the GeS type 3,4) was used for symmetry analysis of the Raman spectra.…”
Section: Introductionmentioning
confidence: 86%
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“…Sn dopant was reported to decrease the transition pressure from 4.5 to 3 GPa. 10,20) Our high-pressure x-ray diffraction study of Pb 0.875 Sn 0.125 Se could assign the orthorhombic phase neither to GeS type nor to the Pnma; 21) nevertheless, the GeS type 3,4) was used for symmetry analysis of the Raman spectra.…”
Section: Introductionmentioning
confidence: 86%
“…A fresh chip of Pb 0.875 Sn 0.125 Se single crystal 10) of ~50 200 200 m 3 size was placed in a hole drilled into a metal gasket of a diamond window cell. KCl was used as a pressure-transmitting medium in order to both enhance the useful signal and reduce the background luminescence.…”
Section: Methodsmentioning
confidence: 99%
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“…In the present work results of high-pressure thermo- [16,17]. A thermal dierence was produced by heating of the anvils.…”
Section: Introductionmentioning
confidence: 94%