The solubility limits of important dopants (La and Y) in aluminum oxynitride (AlON) were measured using wavelength-dispersive spectroscopy (WDS) mounted on a scanning electron microscope, from samples quickly cooled from 18701C. To provide saturated AlON, samples were prepared with dopant concentrations well above the solubility limit, which was confirmed by the appearance of secondary phases using X-ray diffraction, backscattered electron micrographs, and WDS. Measurements were conducted on polished samples without thermal or chemical etching. The results indicate solubility limits of 498782 and 17757128 ppm for La and Y in AlON at 18701C, respectively. The solubility limit of Mg in AlON at 18701C was found to be 44000 ppm. The relation between solubility limit and cation size is briefly discussed.