Application of microwave cavity perturbation techniques in conducting polymers

Wang, Z.H.; Javadi, Hamid; Epstein, Arthur J.

doi:10.1109/imtc.1991.161544

Search citation statements

Order By: Relevance

Paper Sections

Select...

Resonance Cavity Perturbation Methods1

Lanp Tan(χmeas)1

Citation Types

Supporting

Mentioning

Contrasting

Publication Types

Select...

Other1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(2 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…If the sample is shorter than the cavity height, the measured complex polarizability is written as shown in (2) using depolarization factor N defined by the shape of the sample [5].…”

Section: Resonance Cavity Perturbation Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Q-factor change of cavity by sample installation in resonance perturbation method

Miura¹,

Tahara

Sugiyama

et al. 2015

2015 European Microwave Conference (EuMC)

View full text Add to dashboard Cite

In the measuring process of the cavity resonance perturbation method to evaluate permittivity, it has historically been supposed that Q-factor of the cavity itself is not affected by the installation of a sample since the method has been proposed. Recently, several experimental results to show the change of Qfactor by the installation of a sample were found. Measurements and discussions to confirm the change have been made and a method to obtain the intrinsic loss factor of the sample separated from Q-factor change of the cavity is proposed in this paper.

show abstract

“…If the sample is shorter than the cavity height, the measured complex polarizability is written as shown in (2) using depolarization factor N defined by the shape of the sample [5].…”

Section: Resonance Cavity Perturbation Methodsmentioning

confidence: 99%

“…5b is considered as an excess loss newly appeared in the cavity. An equation defining cavity wall loss, L wall , could be described by the surface integral of resistivity loss density over the cavity wall as shown in (5).…”

Section: Lanp Tan(χmeas)mentioning

confidence: 99%