Application of BIB polishing technology in cross-section preparation of porous, layered and powder materials: A review

Microstructure and properties of nano-laminated Y3Si2C2 ceramics fabricated via in situ reaction by spark plasma sintering

“…The phase distributions were characterized by electron back-scattered diffraction (EBSD) using a thermal field emission electron scanning microscope (Verios G4 uc, Thermo Scientific, USA), equipped with an EBSD apparatus operating at 20 kV accelerating voltage. For the EBSD analysis, the samples were polished with the final 1 μm diamond suspension, followed by etching using an ion beam (BIB, TIC 3X, Leica, Germany) for 3 h [15]. The microstructure and phase compositions were investigated by a transmission electron microscope (TEM, Talos™ F200x, Thermo Fisher Scientific, USA) system equipped with EDS system.…”

A critical discussion on the analysis of buried interfaces in Li solid-state batteries. Ex situ and in situ/operando studies

“…BIB polishing is a sample preparation procedure which consists in etching one edge of the sample with a parallel and broad beam of energetic ions, usually Ar + . 59 To be effective in the preparation of cross-sections, the sample must be covered by a masking plate which lets unprotected only the small volume of material that will be etched. The principle of the technique is the same as in FIB, in the sense that a cross-section with welldefined interfaces is obtained as a result of the sputtering of a surface layer of the stacked material with high-energy ions.…”

“…The principle of the technique is the same as in FIB, in the sense that a cross-section with welldefined interfaces is obtained as a result of the sputtering of a surface layer of the stacked material with high-energy ions. However, the broader ion beam makes the surface area sputtered by BIB polishing significantly larger for similar operation times 59 (around 700 μm width x 400 μm depth vs 50 x 50 μm for typical FIB) and it is a cheaper and less timeconsuming method. The energy of the Ar + beam can be varied…”

Microstructure and properties of nano-laminated Y3Si2C2 ceramics fabricated via in situ reaction by spark plasma sintering

“…The phase distributions and grain boundary map were characterized by electron backscattered diffraction (EBSD) using a thermal eld emission electron scanning microscope (Verios G4 uc, Thermo Scienti c, USA) equipped with EBSD apparatus operating at 20 kV accelerating voltage. For the EBSD analysis, the samples were polished with the nal 1 µm diamond suspension, followed by etching through an ion beam (BIB, TIC 3X, Leica, Germany) for 3 h [11]. The microstructure and phase compositions were investigated by transmission electron microscopy (TEM, Talos™ F200x, Thermo Fisher Scienti c, USA) system equipped with EDS system.…”