Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate

Liu, Chien-Hung; Liu, Chin-Chia; Huang, Wen Chen

doi:10.1007/s00542-013-1831-y

Cited by 4 publications

(1 citation statement)

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“…Especially when using an optical coherence tomography system, it will affect the contrast of the image and the subsequent calculation of tissue thickness [22][23][24]. As a result, there are various measurement techniques proposed over the last decade for the simultaneous measurement of the refractive index and thickness of samples [25][26][27][28][29][30][31][32][33][34][35][36][37][38][39][40][41][42][43][44]. However, to the best of our knowledge, there is not any existing method to simultaneously measure the thickness and refractive index for each layer of multilayered samples.…”

Section: Introductionmentioning

confidence: 99%

Thickness and Refractive Index Measurement System for Multilayered Samples

Liu

Weng

2021

IEEE Access

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In order to simultaneously obtain the thickness and refractive index for each layer of multilayered samples, this paper proposes a novel measurement system with a simple structure by using geometric optics. The key point of the overall structure is that the binary linear equation relation between the upper and lower planes of the layer can be known by the distances between laser spots reflected from the layer. Using two optical paths with different incident angles of laser beams, the CCD sensors capture the spot signal for image processing binarization and data sampling. After the obtained laser spots' spacing is substituted into the equations, the thicknesses and refractive indexes of the multilayered samples can be calculated and measured. The proposed measurement system is characterized numerically using simulations on the commercial software program Zemax and then experimentally tested using a laboratory-built prototype. The experiment results show that the refractive indexes and the thicknesses of three-layer samples were measured with high accuracy (with maximum measurement errors of 2.4% and 2% for a refractive index n and thickness d, respectively).INDEX TERMS Auto-focusing microscopy, multilayered samples, optical system, refractive index, Thickness.

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