Applicability assessment for simplified formulas to compute surface impedance at screened surfaces

Pawłowski, Stanisław; Plewako, J.

doi:10.15199/48.2015.12.47

Cited by 3 publications

(4 citation statements)

References 1 publication

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“…The use of Fortran (Intel Parallel Studio XE Composer Edition for Fortran Windows) or C++ (Dev-C++) allows for effective management of available computer hardware resources as well as full control over the accuracy of the obtained results. It was described in the works [32,33], where the authors have a similar approach to solving scientific problems, as well as our previous publications [34]. Based on the presented formulae, a numerical program was prepared to calculate the distribution of the electromagnetic field and the current density flow field in the conductive path and its impedance Z.…”

Section: Calculation Resultsmentioning

confidence: 99%

“…accuracy of the obtained results. It was described in the works [32,33], where the authors have a similar approach to solving scientific problems, as well as our previous publications [34]. Based on the presented formulae, a numerical program was prepared to calculate the distribution of the electromagnetic field and the current density flow field in the conductive path and its impedance Z.…”

Section: Calculation Resultsmentioning

confidence: 99%

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The Influence of the Skin Phenomenon on the Impedance of Thin Conductive Layers

Pawłowski,

Plewako,

Korzeniewska

et al. 2023

Electronics

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This paper analyzes the influence of the skin effect and the proximity effect on the inductance and impedance of thin conductive layers. The motivation for taking up this topic is the initial assessment of the possibility of using conductive layers deposited with the PVD technique on textile materials as strip or planar transmission lines of high-frequency signals (e.g., for transmitting images). This work pursues two goals. The first of them is to develop and test a numerical procedure for calculating the electromagnetic field distribution in this type of issue, based on the fundamental solution method (FSM). The second aim is to examine the impact of the skin phenomenon on the resistance, inductance and impedance of thin conductive paths. The correctness and effectiveness of FSM for the analysis of harmonics of electromagnetic fields in systems containing thin conductive layers were confirmed. Based on the performed simulations, it was found that in the frequency range above 10 MHz, the dependence of resistance and impedance on frequency is a power function with an exponent independent of the path width. Moreover, it was found that for paths with a width at least several times greater than their thickness, the dependence of the phase shift between current and voltage on frequency practically does not depend on the path width.

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Section: Calculation Resultsmentioning

confidence: 99%

Section: Calculation Resultsmentioning

confidence: 99%

The Influence of the Skin Phenomenon on the Impedance of Thin Conductive Layers

Pawłowski,

Plewako,

Korzeniewska

et al. 2023

Electronics

Self Cite

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“…If necessary, it is possible also to apply a different grid load or a different interference source. There are various methods for reducing the level of electrical noise [26]. A view of the complete measurement stand is presented in Figure 3.…”

Section: Measurement System For Evaluating Uncertainty Of Measurement...mentioning

confidence: 99%

The Influence of Noise Level on the Value of Uncertainty in a Measurement System Containing an Analog-to-Digital Converter

2023

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For newly developed measuring systems, it is easy to estimate type-B uncertainties based on technical data from the measuring modules applied. However, it is difficult to estimate A-type uncertainties due to the unknown type and level of interferences infiltrating the measuring system. This is a particularly important problem for measurements carried out in the presence of typical of power grid disturbances. The aim of the research was to develop a method and a measurement stand for experimental assessment of uncertainties in a measuring system that makes use of data acquisition modules containing analog-to-digital converters (ADCs). The paper describes, in detail, the design of a completed test stand. It presents an original application in the LabVIEW environment, which enables testing the dependence of the uncertainties with the quantity of the measurements averaged in a series, for different kinds and levels of interferences infiltrating the measuring path. The results of tests for several popular measuring modules are presented. An analysis of the determined uncertainties was carried out in relation to the parameters of the tested measurement modules and for various levels of interferences. It is proved that an increase in the number of averaged measurements to approx. 100–200 always results in a decrease in uncertainty for each tested module and under all conditions. However, a further increase in the quantity of measurements, even up to 1000 averaged measurements, proved reasonable only for high-accuracy modules, in particular with a high level of interferences. An excessive increase in the quantity of averaged measurements proved a low effect for modules characterised by a low resolution and with a low level of interferences. The measurement results also proved that when estimated, uncertainties in the interference probability distribution are significant, especially if they deviate from normal distribution.

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“…There are methods to limit the level of electrical interferences, e.g. by their reducing (shielding, grounding, galvanic insulation, using filters and separations and other ways of limiting -cutting the amplitude, dissipating part of the energy), and also by their limiting to a "safe" level of interaction with the sensitive devices [2]. All the abovementioned types of interferences reduce the quality of the measurement system by reducing accuracy.…”

Section: Introductionmentioning

confidence: 99%

The Evaluation of Expanded Uncertainty of DC Voltages in the Presence of Electromagnetic Interferences using the LabVIEW Environment

Otomański

Pawłowski

Szlachta

2021

Measurement Science Review

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The paper presents a possible application of integrated LabVIEW environment to the final evaluation of measurement results in direct measurement. The possibilities of presenting and visualizing the uncertainty of measurement results in a convenient and user-friendly form are also discussed. The topics discussed in the paper were presented using a developed application in LabVIEW. The paper discusses the topic of measurement of direct voltages in the presence of strong electromagnetic interferences. These problems are frequently omitted or hardly emphasized. It presents a suitable measuring system, a virtual measuring instrument created in the LabVIEW environment, and the results of tests carried out for an example NI PCI-6221 data acquisition board. The described approach can be applied also in other measurement situations.

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Applicability assessment for simplified formulas to compute surface impedance at screened surfaces

Cited by 3 publications

References 1 publication

The Influence of the Skin Phenomenon on the Impedance of Thin Conductive Layers

The Influence of the Skin Phenomenon on the Impedance of Thin Conductive Layers

The Influence of Noise Level on the Value of Uncertainty in a Measurement System Containing an Analog-to-Digital Converter

The Evaluation of Expanded Uncertainty of DC Voltages in the Presence of Electromagnetic Interferences using the LabVIEW Environment

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