Anomalous X-ray scattering study of composition profile in Fe/Mn superlattice films

Nakayama, Noriaki; Moritani, Isao; Shinjo, Teruya; Fujii, Yasuhiko; Sasaki, Satoshi

doi:10.1088/0305-4608/18/3/013

Cited by 22 publications

(5 citation statements)

References 8 publications

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“…As is well known, a small x-ray contrast between Ni 80 Fe 20 and Fe 50 Mn 50 for Cu Kα radiation exists by virtue of the proximity of the atomic numbers for Ni, Fe and Mn in the periodic table. In general, the incident x-ray energy slightly lower than the absorption edge of lighter elements is expected to greatly enhance the Bragg peak intensity [14]. Therefore, in order to increase both the numbers of observed Bragg peaks and the diffraction intensity, the incident x-ray energy near to the Mn absorption edges (6.5 keV) was tuned using the synchrotron radiation source at BSRF.…”

Section: Low-angle X-ray Diffractionmentioning

confidence: 99%

Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction

Yang

Luo

et al. 2001

J. Phys.: Condens. Matter

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The detailed microstructures of Ni80Fe20/Fe50Mn50 superlattices have been characterized using both x-ray diffraction techniques and transmission electron microscopy. The obvious layered structure, typical column structure and twins which exist in Ni80Fe20/Fe50Mn50 superlattices were observed through performing transmission microscopy. By combining the technique of low-angle x-ray reflectivity (specular and off-specular scans) with the anomalous scattering effect and high-angle x-ray diffraction (using conventional x-ray), we quantitatively analysed the microstructural variation as a function of annealing temperature. It is found that the lateral correlation length, the (111) peak intensity of the superlattices and the average multilayer coherence length all increase with a rise in annealing temperature. The correlated roughness slightly decreases after annealing, while moderate annealing can decrease the root-mean-square roughness at the interfaces of Ni80Fe20/Fe50Mn50 superlattices. The obtained microstructural knowledge will be helpful in understanding the magnetic properties of the Ni80Fe20/Fe50Mn50 exchange bias system.

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Section: Low-angle X-ray Diffractionmentioning

confidence: 99%

Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction

Yang

Luo

et al. 2001

J. Phys.: Condens. Matter

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“…The resulting concentration gradient at the interface leads to a metastable solid solution which is often not taken into account by a number of authors which tend to associate abrupt interfaces with immiscibility. Thus, dynamic segregation has been put forward to explain interfacial alloying in room temperature grown systems such as Au/Ni, 9,34 Fe/Au, 44 Fe/Mn, 45 or Fe/Pt. [44][45][46] The asymmetric mixing of only one element in the other is thus widely encountered in metallic multilayers deposited at room temperature and this has been explained by the surfactant nature of one element during the growth of the other.…”

Section: A Au Segregation During the Growth Of Ni On Aumentioning

confidence: 99%

“…Thus, dynamic segregation has been put forward to explain interfacial alloying in room temperature grown systems such as Au/Ni, 9,34 Fe/Au, 44 Fe/Mn, 45 or Fe/Pt. [44][45][46] The asymmetric mixing of only one element in the other is thus widely encountered in metallic multilayers deposited at room temperature and this has been explained by the surfactant nature of one element during the growth of the other. It is important to underline that in terms of an elastic stress analysis this alloying may lead to a completely false analysis of the data, by describing lattice parameter changes in a purely elastic framework.…”

Section: A Au Segregation During the Growth Of Ni On Aumentioning

confidence: 99%

Interdependence of elastic strain and segregation in metallic multilayers: An x-ray diffraction study of (111) Au/Ni multilayers

Labat

Gergaud

Thomas

et al. 2000

Journal of Applied Physics

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Articles you may be interested inHigh-resolution X-ray diffraction analysis of AlxGa1−xN/InxGa1−xN/GaN on sapphire multilayer structures: Theoretical, simulations, and experimental observations This study concerns the analysis of elastic strains in Au/Ni multilayers whose periods lie in the range 1-5 nm. Lattice parameter measurements have been performed by x-ray diffraction in various directions. The results are interpreted in terms of elastic strain and interfacial mixing. It is shown that considerable strains ͑several percent͒ are encountered within these very thin layers. In the Au sublayers, coherence is never observed with the underlying Ni film and the residual strain relaxes progressively as the Au film thickens. In the Ni sublayers, interfacial mixing controls the lattice parameter and the elastic strain is a function of this mixing. Out of equilibrium mixing of Au into Ni is ascribed to dynamic segregation during the growth of Ni on Au. All these results bring new insights on the still open question of stress relaxation mechanisms in ultrathin films.

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“…indicating a possible application of multilayers to polarizers. Figure 27 shows the intensity variation of the Ist order reflection from a Fe (15 Å)/Mn(50 Å) multilayer [36]. The measurement was carried out by Kyoto group at the Photon Factory with X-rays of 1.25-2.3 Â so as to cover the K-absorption edges of Fe (1.7432 Â) and Mn (1.8959 Â).…”

Section: Reflectance Measurement Using Syn-mentioning

confidence: 99%

Current research activities in the field of multilayers for soft X-rays in Japan

Namioka

1988

Rev. Phys. Appl. (Paris)

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2014 Les programmes en cours de développement au Japon sont passés brièvement en revue. Les thèmes d'études examinés portent sur les principes des optiques envisagées et sur quelques applications, les études de constantes optiques X-UV des substrats et des films minces ainsi que sur les techniques d'évaporation. Abstract. 2014 The present status of studies on soft X-ray multilayers in Japan is briefly reviewed. This includes the design concepts, optical constants of substrates and thin films, fabrication techniques, evaluation methods, and some applications.

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Anomalous X-ray scattering study of composition profile in Fe/Mn superlattice films

Cited by 22 publications

References 8 publications

Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction

Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction

Interdependence of elastic strain and segregation in metallic multilayers: An x-ray diffraction study of (111) Au/Ni multilayers

Current research activities in the field of multilayers for soft X-rays in Japan

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Anomalous X-ray scattering study of composition profile in Fe/Mn superlattice films

Cited by 22 publications

References 8 publications

Study of Ni80Fe20/Fe50Mn50superlattice microstructures by transmission electron microscopy and x-ray diffraction

Study of Ni80Fe20/Fe50Mn50superlattice microstructures by transmission electron microscopy and x-ray diffraction

Interdependence of elastic strain and segregation in metallic multilayers: An x-ray diffraction study of (111) Au/Ni multilayers

Current research activities in the field of multilayers for soft X-rays in Japan

Contact Info

Product

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Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction

Study of Ni₈₀Fe₂₀/Fe₅₀Mn₅₀superlattice microstructures by transmission electron microscopy and x-ray diffraction