2001
DOI: 10.1103/physrevlett.86.2349
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Anomalous Elastic Response of Silicon to Uniaxial Shock Compression on Nanosecond Time Scales

Abstract: We have used x-ray diffraction with subnanosecond temporal resolution to measure the lattice parameters of orthogonal planes in shock compressed single crystals of silicon (Si) and copper (Cu). Despite uniaxial compression along the (400) direction of Si reducing the lattice spacing by nearly 11%, no observable changes occur in planes with normals orthogonal to the shock propagation direction. In contrast, shocked Cu shows prompt hydrostaticlike compression. These results are consistent with simple estimates o… Show more

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Cited by 176 publications
(111 citation statements)
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“…An equiaxed 5-nm void is initially created in the center of the cell with full atomistic resolution being provided ab initio within a 16a 0 16a 0 16a 0 region surrounding the void. The triangulation is rapidly coarsened with distance to the void elsewhere, resulting in an initial computational mesh containing 31 933 nodes.Recent experimental data [13] suggest that the material response within a strong shock is essentially volumetric. We therefore drive the void expansion by prescribing pure dilatational displacements over the exterior boundary of the computational cell.…”
mentioning
confidence: 99%
“…An equiaxed 5-nm void is initially created in the center of the cell with full atomistic resolution being provided ab initio within a 16a 0 16a 0 16a 0 region surrounding the void. The triangulation is rapidly coarsened with distance to the void elsewhere, resulting in an initial computational mesh containing 31 933 nodes.Recent experimental data [13] suggest that the material response within a strong shock is essentially volumetric. We therefore drive the void expansion by prescribing pure dilatational displacements over the exterior boundary of the computational cell.…”
mentioning
confidence: 99%
“…Given that this element can be manufactured in an almost perfect, defectfree form, it might first appear to be an ideal test-bed for studying the fundamental physics of shock compression. However, in many ways the opposite has seemed to be true, in that despite many attempts, a full understanding of how such perfect single crystals react at the lattice level to rapid uniaxial loading has remained surprisingly elusive, with apparently differing results and interpretations being put forward between gas gun experiments [5,6] and those performed on a shorter time-scale employing laser-plasmabased drivers [7].…”
Section: Introductionmentioning
confidence: 99%
“…However, recent work employing nanosecond white-light Laue diffraction to diagnose laser-driven shocks in single crystal silicon shocked along the [100] axis has reconfirmed that a complex elastic response, first observed by Loveridge-Smith et al [7], indeed occurs [8]. This work showed that when silicon is shock-compressed to stresses in the regime of a few 10's of GPa on nanosecond timescales, a leading double elastic-wave structure can form in compression, which, upon breakout from a free surface, can also result in a state of elastic tension.…”
Section: Introductionmentioning
confidence: 99%
“…With the development of x-ray diffraction of dynamic systems, [6,7,17,18] it is possible to make a determination of crystal structure in-situ during the compression process. These in-situ measurements are critical to understanding how materials react under presssure as the crystallographic structure is fundamental in determining material properties.…”
Section: X-ray Diffraction From Dynamically Compressed Materialsmentioning
confidence: 99%
“…These pressure should be obtainable in the next generation of high energy density experimental facilities such as the National Ignition Facility (NIF) [4]. This paper discusses how the crystal structure can be measured in dynamically compressed samples using in-situ x-ray diffraction [5,6,7]. First, a brief discussion of shock and shockless compression is presented as a means of obtaining high pressures.…”
Section: Introductionmentioning
confidence: 99%