Anodization and Sulfation of Tetrabasicleadsulfate in Sulfuric Acid: In Situ Monitoring of Electrode Surface Phases by Laser Raman Scattering

Varma, Ravi; Cook, G.M.; Yao, N.P.

doi:10.1149/1.2127573

Cited by 7 publications

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“…Second, it permits the study of progressive changes in the reaction products during an electrochemical experiment. Varma, Cook, and Yao recently demonstrated these advantages in their study of changes in lead-battery active materials during the formation process (11). A disadvantage of the in situ approach is that only a thin surface layer of the corrosion film can be analyzed.…”

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confidence: 99%

Photoelectrochemical and Microprobe Laser Raman Studies of Lead Corrosion in Sulfuric Acid

Bullock

Trischan

Burrow

1983

J. Electrochem. Soc.

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Microprobe laser Raman spectroscopy and photoelectrochemistry are two techniques which have recently been applied to the study of lead corrosion films. In this paper, we have used these techniques to study lead corrosion between 0.4 and 1.0V (vs. normalHg/Hg2SO4/1MH2SO4 ) in 1MH2SO4 , where lead oxides form beneath a PbSO4 film. Photoconductivity spectra were used to determine the bandgap energies of the lead oxides in situ during the constant‐potential corrosion. Cross sections of the corrosion films were then analyzed by microprobe laser Raman spectroscopy. In addition, open‐circuit potential decay curves of lead corrosion films were recorded. The results elucidate the mechanism of oxide film formation and explain discrepancies found in previous photoelectrochemical studies of lead corrosion.

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confidence: 99%

Photoelectrochemical and Microprobe Laser Raman Studies of Lead Corrosion in Sulfuric Acid

Bullock

Trischan

Burrow

1983

J. Electrochem. Soc.

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“…Laser Raman scattering was used for in situ monitoring of the surface layer formed during anodization and sulfation of tetrabasiclead sulfate (946). The composition of oxides grown on PblnAu films after rf oxidation were examined with XPS (56, 57).…”

Section: Semiconductorsmentioning

confidence: 99%

Forensic science

Brettell¹,

Saferstein²

1983

Anal. Chem.

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He Joined the company in 1959 as a radiochemist. His current work is directed toward developing advanced techniques for semiconductor materials characterization using electron beam (scanning Auger) and in microprobe techniques for chemical imperfections. X-ray topography, and scanning transmission electron microscopy techniques for physical imperfections. Larrabee earned a B.Sc. from the University ol Bishop's College In Quebec and an M.Sc. in chemistry from McMaster University in Ontario, Canada. He has published in analytical, electrochemical, and instrumentation journals and contributed chaplers In books. He has coauthored a book on the characterization of semiconductor materials and coedited a book on the characterization of solid surfaces. Larrabee is a member of the ACS, Electrochemical Society, SAS, and the Dallas Society of Analytical Chemists. R. Allen Bowling received his B.S. In Chemistry from the University ol Alabama and a Ph.D. In Chemistry from ihe University of Tennessee.He held an Alexander von Humboldt postdoctoral research position at the Institute ol Inorganic Chemistry, University of Frankfurt, West Germany, from March 1979 to July 1980. He joined Texas Instruments Incorporated in September 1980 as a process control engineer in a semiconductor processing area. In January 1982, he became a member of the technical staff in the Materials Characterization Branch of the Materials Science Laboratory of Texas Instruments, where he is presently responsible for Auger and XPS instrumentation. Bowling is a member of the Electrochemical Society and the American Vacuum Society.

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In situ characterization of electrode–electrolyte interfaces using spectroscopic techniques

Miles

1983

Surface & Interface Analysis

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A review of ultravioletlvisible, infra-red and Raman spectroscopic techniques (excluding ellipsometry), applied to the in sttu characterization of immersed electrodes is presented. Literature reports involving transmission and internal reflectance at optically transparent electrodes, and also external specular reflectance at planar electrodes both in the visible and in the infra-red spectral regions are described. Raman techniques covered include not only recent developments in surface-enhanced Raman scattering but also unenhanced Raman scattering, resonance Raman scattering and other non-linear processes. Specialized instrumentation requirements are discussed and experimental methodology relevant to the characterization of electrochemical systems is outlined. The report concludes by highlighting the advantages and limitations of the various in siru spectroscopic techniques indicating likely areas of development in the future.

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Anodization and Sulfation of Tetrabasicleadsulfate in Sulfuric Acid: In Situ Monitoring of Electrode Surface Phases by Laser Raman Scattering

Abstract: not Available.

Cited by 7 publications

References 0 publications

Photoelectrochemical and Microprobe Laser Raman Studies of Lead Corrosion in Sulfuric Acid

Photoelectrochemical and Microprobe Laser Raman Studies of Lead Corrosion in Sulfuric Acid

Forensic science

In situ characterization of electrode–electrolyte interfaces using spectroscopic techniques

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