Annular dark-field imaging: Resolution and thickness effects

Hillyard, Sean; Loane, Russell F.; Silcox, J.

doi:10.1016/0304-3991(93)90209-g

Cited by 119 publications

(65 citation statements)

References 24 publications

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“…The background signal is generated from the average scattering from the material sampled by the de-channelled probe and, therefore, gives non-local information about the specimen. Hence, in order to associate the change in the column intensity ratio with the change in local composition, the underlying background signal must be removed before the column ratio is measured [18][19][20][21][22][23]. However, it is not a straight forward matter to separate the background signal from the high-resolution column intensities especially across interfaces where the background changes in value.…”

Section: Introductionmentioning

confidence: 99%

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Column ratio mapping: A processing technique for atomic resolution high-angle annular dark-field (HAADF) images

Robb

Craven

2008

Ultramicroscopy

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Section: Introductionmentioning

confidence: 99%

“…In addition, the structure and composition of the atomic columns of the specimen also influence the column ratio as does the specimen thickness [18][19][20][21][22][23][24]. Hence, it is not always possible to definitively state the Group III column composition from a single value of the column ratio.…”

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confidence: 99%

Column ratio mapping: A processing technique for atomic resolution high-angle annular dark-field (HAADF) images

Robb

Craven

2008

Ultramicroscopy

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“…The HAADF image contrast is also affected by the sample's thickness due to the longitudinal coherence difference along the atomic columns, the probe channeling effect and probe intensity transfer between atomic columns [41][42][43][44][45][46]. As shown in figure S1 (available at stacks.iop.org/Nano/23/ 335706/mmedia), the surfaces of rutile twins are faceted, the thickness along the twin boundary equals the projection of the diamond shape of (011) facets, the thickness along the twin boundary first increases and then decreases.…”

Section: Resultsmentioning

confidence: 99%

Direct oxygen imaging in titania nanocrystals

Lü¹,

Bruner²,

Casillas³

et al. 2012

Nanotechnology

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Recently, rutile nanotwins were synthesized using high temperature organic solvent methods, yielding two kinds of common high-quality rutile twinned nanocrystals, (101) and (301) twins, accompanied by minor rutile nanorods (Lu et al 2012 CrystEngComm 14 3120-4). In this report, the atomic structures of the rutile and anatase nanocrystals are directly resolved with no need for calculation or image simulation using atomic resolution STEM techniques. The locations of the oxygen rows in the rutile twins' boundaries are directly determined from both HAADF images and ABF images. To the best of our knowledge, this is the first time oxygen columns have been distinguished in rutile twin boundaries using HAADF and BF imaging.

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“…High angle annular dark field (HAADF) STEM imaging is typically employed to give atomic number (Z) contrast images due to the collection of Rutherford-like scattering Jesson, 1991, 1990). In a qualitative model of HAADF image contrast, high-spatial resolution information is given by atomic column intensities that are associated with probe channelling (Dwyer and Etheridge, 2003;Hillyard et al, 1993;Rossouw, 2003). In comparison, the underlying background signal is generated by the average scattering from the de-channelled probe and therefore provides non-local information about the specimen.…”

Section: Introductionmentioning

confidence: 99%

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Robb

Finnie

Craven

2012

Micron

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. (2012) Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy. Micron, 43 (10 AbstractThe image processing technique of column ratio mapping was applied to aberration-corrected high angle annular dark field (HAADF) images of short period MBE (molecular beam epitaxy) grown InAs/GaAs superlattices. This method allowed the Indium distribution to be mapped and a more detailed assessment of interfacial quality to be made. Frozen-phonon multislice simulations were also employed to provide a better understanding of the experimental column ratio values. It was established that ultra-thin InAs/GaAs layers can be grown sufficiently well by MBE. This is despite the fact that the Indium segregated over 3-4 monolayers. Furthermore, the effect of the growth temperature on the quality of the layers was also investigated. It was demonstrated that the higher growth temperature resulted in a better quality superlattice structure.

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Annular dark-field imaging: Resolution and thickness effects

Cited by 119 publications

References 24 publications

Column ratio mapping: A processing technique for atomic resolution high-angle annular dark-field (HAADF) images

Column ratio mapping: A processing technique for atomic resolution high-angle annular dark-field (HAADF) images

Direct oxygen imaging in titania nanocrystals

Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

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