Anion Distributions and Phase Transitions in CuS1-xSex(x = 0-1) Studied by Raman Spectroscopy

Structural properties of Cu(In,Ga)Se2 thin films prepared from chemically processed precursor layers

“…Since these phases are formed from the surface of the layer they absorb the signal from the underlying IGS to a large extent. Raman spectroscopy measurements of samples annealed at 250°C reveal a slight blue shift in the position of the Cu-Se peak, consistent with the formation of CuSe from Cu-rich selenides [17]. Due to the volume increase accompanying the formation of CuSe, no signal can be detected from the IGS layer in this spectrum.…”

Chemical incorporation of copper into indium selenide thin‐films for processing of CuInSe2 solar cells

“…When the selenization was interrupted at 250°C, no indium selenide peaks were observed in the Raman spectrum, however two new peaks were present at 263 and 275cm -1 . The peak at 263cm -1 has been associated with CuSe [25], however no reports of an accompanying peak at 275cm -1 could be found in the literature. The diffractogram measured from a sample with similarly interrupted selenization (displayed in Figure 1) indicates the presence of both CuSe and In 2 Se 3 phases, therefore the absence of the indium selenide peaks in the Raman spectrum is attributed to a phase separation through the depth of the layer, leading to the Raman signal being generated solely within the copper selenide surface layer.…”

Raman microprobe characterization of electrodeposited S-rich CuIn(S,Se)2 for photovoltaic applications: Microstructural analysis

“…The peak at 240 cm −1 is attributed to the presence of trigonal elementary selenium ͑Se͒, 13 while the peak at 261 cm −1 is characteristic of Cu-Se compounds. The absence of intense low-frequency bands at 17 and 42 cm −1 characteristic of the covellite-type structure ͑CuSe͒, 14 and the analysis of the XRD spectra, points to a different binary, probably Cu 2 Se, though the coexistence of the covellite CuSe phase cannot be discarded. Figure 3 ͑left͒ shows an OM image of the surface of the as-grown sample.…”