2009
DOI: 10.1016/j.tsf.2008.10.094
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Structural properties of Cu(In,Ga)Se2 thin films prepared from chemically processed precursor layers

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Cited by 10 publications
(3 citation statements)
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“…2, indicating good crystalline quality. The (112) peak is slightly shifted towards smaller angle in agreement with the stoichiometry of CuIn0.7Ga0.3Se2 [13]. Using the Scherrer equation, a crystal size of 40 nm was calculated.…”
Section: Resultssupporting
confidence: 69%
“…2, indicating good crystalline quality. The (112) peak is slightly shifted towards smaller angle in agreement with the stoichiometry of CuIn0.7Ga0.3Se2 [13]. Using the Scherrer equation, a crystal size of 40 nm was calculated.…”
Section: Resultssupporting
confidence: 69%
“…Finally, cationic ion‐exchange reactions, where metal salt cations in solution exchange with cations in an immersed thin film, have been investigated as a means to add elements into a layer in order to form a precursor that may be converted to CIGS. The formation of CuInS 2 has been demonstrated from chemically deposited ZnS 123 and CI(G)S devices with ∼4% efficiency have been demonstrated by adding Cu to evaporated indium (gallium) selenide layers 124, 125.…”
Section: Electrochemical Processes For Cigs Depositionmentioning
confidence: 99%
“…210-230 cm À 1 is attributed to the presence of an Se [21,22]. Raman peak at around 250-270 cm À 1 is due to the formation of Cu 2 À x Se compound, since the Cu-poor (e.g., CuSe) and Cu-rich (e.g., Cu 2 Se) compounds exhibit characteristic peaks at about 259 and 261 cm À 1 , respectively [23]. Compared to the CuInSe 2 film deposited at 1.60 mM [Se 4 + ], the sample deposited at 1.92 mM [Se 4 + ] shows a shoulder peak at ca.…”
Section: Methodsmentioning
confidence: 99%