Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks

Gilbert, Olivier; Deumié, Carole; Amra, Claude

doi:10.1364/opex.13.002403

Cited by 56 publications

(32 citation statements)

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“…Finally, the theoretical principles behind this roughness measurement method are clearly compatible with other spectral studies (wavelength switching of incoherent sources) and polarization analysis, as previously defined by our team on a standard ARS instrument [20][21][22].…”

Section: Discussionsupporting

confidence: 67%

Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability

Zerrad

Lequime

Deumié

et al. 2017

International Conference on Space Optics — ICSO 2008

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The principle of a new scattering measurement system including a mobile lighting and a fixed CCD array is described. This new system allows a spatially resolved light scattering characterization. Moreover it is possible to separate localized defects contribution from the local roughness measurement. The comprehensive characterization of optical coatings can be performed with this set-up, and some examples will be given.

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Section: Discussionsupporting

confidence: 67%

Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability

Zerrad

Lequime

Deumié

et al. 2017

International Conference on Space Optics — ICSO 2008

Self Cite

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“…Complementary to EWLS is an ellipsometric scattering technique (called scattering ellipsometry (SE) [91 • ] or Ellipsometry of Angle-Resolved Scattering (E.A.R.S.) [92]), where a distinction of scattering contributions relies on a polarization analysis of the scattered light. While SE has not yet been applied to colloid and interface science, it has a high potential in this field.…”

Section: Planar Interfacesmentioning

confidence: 99%

“…An important feature of FOVPT which is essential for many applications is a factorization in a polarization term and a term including the surface roughness, described by the mean squared amplitude |Z(q The extinction conditions for the polarization optics therefore do not depend on the roughness. This feature has been used to mask out either bulk or interface scattering, either in scattering measurements [92,94] or in an imaging application [95]. The theoretical description has been generalized to a multi-layer stack with rough interfaces between the layers [96].…”

Section: Planar Interfacesmentioning

confidence: 99%

Light scattering near and from interfaces using evanescent wave and ellipsometric light scattering

Sigel

2009

Current Opinion in Colloid & Interface Science

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The broad range of interface light scattering investigations in recent years shows the power and the versatility of these techniques to address new and open questions in colloid and interface science and the soft condensed matter field. Structural information for polymers, liquid crystals, or colloids close to planar or spherical colloidal interfaces are either captured with long range light scattering resolution, or in a complementary approach by high resolution ellipsometric techniques. Of special interest is the dynamic behavior close to or in interfaces, since it determines material properties and responses to external fields. Due to the broad dynamical range and the high scattering contrast for visible light, interface light scattering is a key to elucidate soft matter interfacial dynamics. This contribution reviews experimental and related theoretical approaches for interface light scattering and further gives an overview of achievements based on such techniques.

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“…Angle-resolved ellipsometry has proved to be a successful technique, although the method becomes increasingly complex when analyzing highly scattering materials with significant surface roughness [23][24][25][26]. A completely different approach is to coat the surface of the sample with a thin opaque metallic layer, thereby blocking the bulk reflectance [27].…”

Section: Introductionmentioning

confidence: 99%

Separation of surface and bulk reflectance by absorption of bulk scattered light

et al. 2013

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A method is proposed for separating light reflected from turbid media with a rough surface into a bulk and a surface component. Dye is added to the sample, thereby increasing absorption and canceling bulk scattering. The remaining reflected light is surface reflectance, which can be subtracted from the total reflectance of an undyed sample to obtain the bulk component. The method is applied to paper where the addition of dye is accomplished by inkjet printing. The results show that the bulk scattered light is efficiently canceled, and that both the spectrally neutral surface reflectance and the surface topography of the undyed paper is maintained. The proposed method is particularly suitable for characterization of dielectric, highly randomized materials with significant bulk reflectance and rough surfaces, which are difficult to analyze with existing methods. A reliable separation method opens up for new ways of analyzing, e.g., biological tissues and optical coatings, and is also a valuable tool in the development of more comprehensive reflectance models.

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Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks

Cited by 56 publications

References 0 publications

Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability

Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability

Light scattering near and from interfaces using evanescent wave and ellipsometric light scattering

Separation of surface and bulk reflectance by absorption of bulk scattered light

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