Angle-resolved electron probe microanalysis revisited

Cazaux, J.

doi:10.1088/0022-3727/44/35/355502

Cited by 8 publications

(8 citation statements)

References 15 publications

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“…Electrons interacting with solid surfaces in the divertor region of fusion plasmas 3 , dielectric barrier discharges [4][5][6] , dusty plasmas 7-9 , Hall thrusters 10,11 , or electric probe measurements 12 have typically energies below 10 eV, much less than the electron energy used in surface analysis [13][14][15] or materials processing 16 . The energies there are a few 100 eV, an energy range, where the physical processes involved, backscattering and secondary electron emission, are sufficiently well understood [17][18][19][20][21][22][23][24] to make these techniques reliable tools of applied science.…”

Section: Introductionmentioning

confidence: 99%

Microscopic theory of electron absorption by plasma-facing surfaces

Bronold

Fehske

2016

Plasma Phys. Control. Fusion

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We describe a method for calculating the probability with which the wall of a plasma absorbs an electron at low energy. The method, based on an invariant embedding principle, expresses the electron absorption probability as the probability for transmission through the wall's long-range surface potential times the probability to stay inside the wall despite of internal backscattering. To illustrate the approach we apply it to a SiO2 surface. Besides emission of optical phonons inside the wall we take elastic scattering at imperfections of the plasma-wall interface into account and obtain absorption probabilities significantly less than unity in accordance with available electron-beam scattering data but in disagreement with the widely used perfect absorber model.

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Section: Introductionmentioning

confidence: 99%

Microscopic theory of electron absorption by plasma-facing surfaces

Bronold

Fehske

2016

Plasma Phys. Control. Fusion

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“…Utilizing the electron's large penetration depth at the energies of a few electron volts [47], typical for plasma applications, we showed that the chain of events described in the previous paragraph gives rise to a sticking probability S(E, ξ) which is the product of the probability T (E, ξ) for quantum-mechanical transmission through the surface potential and the probability to stay inside the surface despite of inelastic backscattering inside it [31,32]. To make the connection between absorption by and backscattering from the dielectric surface explicit, we recast the expression for S(E, ξ) in the form…”

Section: Electron Absorption and Backscatteringmentioning

confidence: 99%

Electron kinetics at the plasma interface

et al. 2018

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The most fundamental response of an ionized gas to a macroscopic object is the formation of the plasma sheath. It is an electron depleted space charge region, adjacent to the object, which screens the object's negative charge arising from the accumulation of electrons from the plasma. The plasma sheath is thus the positively charged part of an electric double layer whose negatively charged part is inside the wall. In the course of the Transregional Collaborative Research Center SFB/TRR24 we investigated, from a microscopic point of view, the elementary charge transfer processes responsible for the electric double layer at a floating plasma-wall interface and made first steps towards a description of the negative part of the layer inside the wall. Below we review our work in a colloquial manner, describe possible extensions, and identify key issues which need to be resolved to make further progress in the understanding of the electron kinetics across plasma-wall interfaces.

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“…This applies, e.g., to (La,Sr)MnO 3 (LSM) and Y 2 O 3 -doped ZrO 2 , (YDZ), which are commonly used in SOFC cathodes [4,5,[8][9][10]. In some instances, SE SEM imaging at low electron energies (0.6-2 keV) and employing an in-lens SE detector have also been successful to generate material contrast in SOFC anodes or cathodes [4,6,[11][12][13][14], because SE coefficients increase with decreasing electron energy and the effect of the work function of the material influences SE emission [12,15]. However, sample charging and the resulting local change of work function greatly affects SE imaging.…”

Section: Introductionmentioning

confidence: 99%

Optimization of Material Contrast for Efficient FIB‐SEM Tomography of Solid Oxide Fuel Cells

et al. 2020

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Focused ion beam (FIB)-scanning electron microscopy (SEM) serial sectioning tomography has become an important tool for three-dimensional microstructure reconstruction of solid oxide fuel cells (SOFC) to obtain an understanding of fabrication-related effects and SOFC performance. By sequential FIB milling and SEM imaging a stack of cross-section images across all functional SOFC layers was generated covering a large volume of 3.5Á10 4 μm 3. One crucial step is image segmentation where regions with different image intensities are assigned to different material phases within the SOFC. To analyze all relevant SOFC materials, it was up to now mandatory to acquire several images by scanning the same region with different imaging parameters because sufficient material contrast could otherwise not be achieved. In this work we obtained high-contast SEM images from a single scan to reconstract all functional SOFC layers consisting of a Ni/Y 2 O 3-doped ZrO 2 (YDZ) cermet anode, YDZ electrolyte and (La,Sr)MnO 3 /YDZ cathode. This was possible by using different, simultaneous read-out detectors installed in a stateof-the-art scanning electron microscope. In addition, we used a deterministic approach for the optimization of imaging parameters by employing Monte Carlo simulations rather than trial-and-error tests. We also studied the effect of detection geometry, detecting angle range and detector type.

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Angle-resolved electron probe microanalysis revisited

Cited by 8 publications

References 15 publications

Microscopic theory of electron absorption by plasma-facing surfaces

Microscopic theory of electron absorption by plasma-facing surfaces

Electron kinetics at the plasma interface

Optimization of Material Contrast for Efficient FIB‐SEM Tomography of Solid Oxide Fuel Cells

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