Abstract:We present a method for analyzing the homogeneity of the χ(2) distribution in poled nonlinear optical polymer films. The second-order nonlinear coefficient in these polymers is commonly induced by electric-field poling methods which can lead to a χ(2) distribution with poor spatial homogeneity. In this letter, we analyze the χ(2) distribution using scanning Kelvin microscopy. This allows us to detect the height and the direction of the induced polarization through the probing of the countercharges that are pre… Show more
“…To this aim, besides pressure pulse and thermal methods the scanning Kelvin probe has been revived in the last years. This measurement technique was introduced by Lord Kelvin and further developed by Zisman as well as by many others [10][11][12][13][14][15][16][17][18]. The method allows to determine the work function difference of metals or the surface potential of insulators contactless.…”
“…To this aim, besides pressure pulse and thermal methods the scanning Kelvin probe has been revived in the last years. This measurement technique was introduced by Lord Kelvin and further developed by Zisman as well as by many others [10][11][12][13][14][15][16][17][18]. The method allows to determine the work function difference of metals or the surface potential of insulators contactless.…”
“…The vibrating capacitor or Kelvin1, 2 method is a well‐established experimental technique for measuring the contact potential difference (CPD) or the work function of metal3 and semiconductor surfaces 4, 5. In addition, the method can be applied to other classes of materials such as polymers6 and carbon black (CB) 7. Here, the sensitivity of the CPD to the appearance of electronic surface states and surface charges is used.…”
This article reports a novel application of scanning Kelvin microscopy for exclusively revealing the distribution of a percolated conductive filler network in heterogeneous materials. The materials under investigation are carbon black and carbon nanotube-filled epoxies with a highly inhomogeneous conductivity distribution due to their fabrication. The Kelvin method is demonstrated to be especially suitable for resolving the resistive particle network in these kinds of composite materials with sample resistance levels in the megaohm range. Transmission optical microscopy reveals matches between the scanning Kelvin images and the sample morphologies, whereas the percolating backbone cannot be distinguished in the optical micrographs.
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