2001
DOI: 10.1002/app.2197
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Imaging of conductive filler networks in heterogeneous materials by scanning Kelvin microscopy

Abstract: This article reports a novel application of scanning Kelvin microscopy for exclusively revealing the distribution of a percolated conductive filler network in heterogeneous materials. The materials under investigation are carbon black and carbon nanotube-filled epoxies with a highly inhomogeneous conductivity distribution due to their fabrication. The Kelvin method is demonstrated to be especially suitable for resolving the resistive particle network in these kinds of composite materials with sample resistance… Show more

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Cited by 16 publications
(13 citation statements)
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“…When the KPFM servo is turned on (see figure 1(b)), it is possible to map the local surface contact potential difference on the PI-SWNTs film in figure 2(h). SWNTs can be distinguished by appearing brighter, with higher [16,20,47]. In addition, from the amplitude response of the electrostatic force at 2ω elec (see equation (2)), ∂C/∂d can be measured and mapped as in figure 2(i).…”
Section: Understanding Single-pass Kpfmmentioning
confidence: 99%
See 1 more Smart Citation
“…When the KPFM servo is turned on (see figure 1(b)), it is possible to map the local surface contact potential difference on the PI-SWNTs film in figure 2(h). SWNTs can be distinguished by appearing brighter, with higher [16,20,47]. In addition, from the amplitude response of the electrostatic force at 2ω elec (see equation (2)), ∂C/∂d can be measured and mapped as in figure 2(i).…”
Section: Understanding Single-pass Kpfmmentioning
confidence: 99%
“…It has also been applied to identify dissimilar components in heterogeneous materials [18], and to study the dynamic variation of the local work function at the nanoscale in a poly (3,4-ethylenedioxypyrrole)/carbon nanotube composite [19]. At the microscopic scale, Kelvin probe microscopy (not AFM based) has been used to reveal the distribution of induced conductive networks of carbon black (CB) and CNTs in epoxy polymers [20]. Given the recent surge of interest in the use of dynamic electrical AFM techniques for nanocomposite characterization, there is a strong need to understand the fundamentals of image formation in these techniques, their spatial and depth resolution, and their experimental advantages and disadvantages.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, Breuer and Sundararaj [29] report difficulty in implementing electron microscopy due to issues with regard to sample preparation and the lack of polymer/ CNT contrast. They list other methods, such as magnetic force microscopy (MFM) which exploits the interaction between the CNTs and the applied magnetic field, thus allowing direct visualisation of the polymer embedded CNTs [29] and scanning Kelvin microscopy which employs an oscillating probe to determine the conductivity distribution in heterogeneous materials such as the conducting CNTs in the insulating polymer matrix [98]. Yet another characterisation method that has been used is X-ray diffraction (XRD), as employed by Dror et al [18].…”
Section: Synthesis Of Polymer Nanocomposite Fibers By Electrospinningmentioning
confidence: 99%
“…Among the electric techniques, EFM is mainly used for the characterization of the local electronic and dielectric properties of conducting, insulating and semiconducting materials (Jespersen & Nygård, 2007;Kader, Choi, Lee, & Nah, 2005;Prasse, Ivankov, Sandler, Schulte, & Bauhofer, 2001). Kelvin probe force microscopy (KPFM) is another electric SPM technique widely used for the measurement of the electric surface characteristics of materials.…”
Section: Characterization Of Nanoparticles and Nanosystemsmentioning
confidence: 99%