Analyzing the design-for-test techniques in a multiple substrate MCM

A general-purpose, reconfigurable logic circuit, including an FPGA and a standard USB communications port, is introduced to implement many of the functions of traditional automated test equipment (ATE). An optional port to local memory is included for applications requiring extensive test vector storage. The test core provides a substantial number of programmable I/O for testing other circuits. It may be used either to enhance the capabilities of ATE or to provide autonomous testing within large systems or arrays of components.Based upon limitations of current BIST and ATE, the need for the digital test core is described. The test core concept is introduced, and a specific circuit design is presented. This design is first evaluated independently and is then embedded into two example applications, including: (1) a high speed transmitter/receiver, and ( 2 ) a continuity checker for high-density flip-chips.

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“…6 GHz. Even though these speeds are attainable, the equipment cost is very high (-$10k per channel).…”

Section: Introductionmentioning

confidence: 99%

Multi-purpose digital test core utilizing programmable logic

Davis

Keezer

Proceedings. International Test Conference

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“…Like most test problems, they boil down to controllability and observability problems -combining several VLSI components in a small package limits test accessibility. This causes problems for test generation and the application of test vectors using test equipment [2,3,4]. One method to lessen the burden on these test steps is to increase the controllability and observability.…”

Section: Introductionmentioning

confidence: 99%