2015
DOI: 10.1088/1757-899x/70/1/012001
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Analyzing the contents of residual and plasma-supporting gases inside a vacuum deposition unit chamber

Abstract: Abstract. The paper describes a quadruple mass-spectrometer method, which is used to analyze the content of residual gas in a vacuum chamber of the ARM NTM (Automatised Working Area) ion-plasma unit. This unit is used to perfect the magnetron deposition process for coating radio-reflecting surfaces. The intake of pure argon into the chamber revealed up to 0.3 % of impurities in the plasma-supporting gas, including 0.02 % of water and oxygen. A significant presence of hydrocarbon gases is explained by the prese… Show more

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“…In comparison we can see that the high quality GOST 10157-79 argon, used in the test has the following percentage of impurities: under 0.0007 % oxygen, under 0.005 % nitrogen, under 0.0009 % water, under 0.0005 % hydrocarbon compounds. The total percentage of argon is over 99.99 % [3]. Thus, the percentage of water and total sum of impurities in the plasma-supporting gas is significantly greater than required by the state standard for argon intake.…”
Section: Figurementioning
confidence: 95%
“…In comparison we can see that the high quality GOST 10157-79 argon, used in the test has the following percentage of impurities: under 0.0007 % oxygen, under 0.005 % nitrogen, under 0.0009 % water, under 0.0005 % hydrocarbon compounds. The total percentage of argon is over 99.99 % [3]. Thus, the percentage of water and total sum of impurities in the plasma-supporting gas is significantly greater than required by the state standard for argon intake.…”
Section: Figurementioning
confidence: 95%