2021
DOI: 10.1063/5.0051599
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Analyzer-free, intensity-based, wide-field magneto-optical microscopy

Abstract: In conventional Kerr-and Faraday microscopy the sample is illuminated with plane-polarised light and a magnetic domain contrast is generated by an analyser making use of the Kerr-or Faraday rotation. In this paper we demonstrate possibilities of analyser-free magneto-optical microscopy based on magnetisationdependent intensity modulations of the light: (i) The transverse Kerr effect can be applied for in-plane magnetised material, demonstrated for an FeSi sheet. (ii) Illuminating the same sample with circularl… Show more

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Cited by 9 publications
(5 citation statements)
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“…In this case, the polarization state can be switched, thereby implementing the maximum possible modulation without the use of an analyzer in the observation system. In magneto-optical microscopy, the effects of linear dichroism can be efficient in situations where the magnetic circular dichroism vanishes, for example, for the visualization of antiferromagnetic domains [18].…”
Section: Discussionmentioning
confidence: 99%
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“…In this case, the polarization state can be switched, thereby implementing the maximum possible modulation without the use of an analyzer in the observation system. In magneto-optical microscopy, the effects of linear dichroism can be efficient in situations where the magnetic circular dichroism vanishes, for example, for the visualization of antiferromagnetic domains [18].…”
Section: Discussionmentioning
confidence: 99%
“…Magneto-optical effects associated with a change in the intensity of reflected or transmitted light, called intensity effects, are widely used in integrated optics devices to create optical non-reciprocal elements [1][2][3], spin wave detectors [4], chemical sensors and biosensors [5][6][7][8][9][10][11][12], magnetometers [13][14][15][16][17] and visualizations of magnetic structures [18,19].…”
Section: Introductionmentioning
confidence: 99%
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“…This progress is supported by the revival of anti-reflection schemes [66] for achieving huge MO contrasts for even nanometre thick films [46]. This helps enabling analyser free domain imaging modes [46,72].…”
Section: Statusmentioning
confidence: 97%
“…The challenge has been partly overcome by advanced illumination schemes with simultaneous [64,67] or sequentially alternating illumination schemes [68,69], enabling the separation of the different Kerr effects for the MO image formation and the realization of quantitative Kerr effect micrographs [64,[67][68][69]71]. With the increase of dynamic range and signal-to-noise ratio in current complementary metal-oxide semiconductor (CMOS) camera technology, imaging of the purely transverse Kerr effect with sensitivity only to the in-plane magnetization has become achievable [72]. This progress is supported by the revival of anti-reflection schemes [66] for achieving huge MO contrasts for even nanometre thick films [46].…”
Section: Statusmentioning
confidence: 99%