Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines

Zhou, Xiang; Li, Binhong; Li, Ningdong; Ravelo, Blaise; Hu, Xiaofeng; Ji, Qizheng; Wan, Fang; Fontgalland, Glauco

doi:10.1109/access.2020.2988096

Cited by 28 publications

(31 citation statements)

References 40 publications

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“…In order to quantify more clearly the contribution of the present NGD design in the frequency domain, we traditionally deal with what was done previously. Based on the proposition in the previous work, the NGD performance is also assessed with the NGD figure-of-merit (FOM), which is defined in [18,24] formulated by:…”

Section: Discussion On the Bp Ngd Performance Of The Proposed Circuitmentioning

confidence: 99%

“…To overcome the attenuation loss, active NGD circuits [14,19,20] were designed and experimented. It has been found since the early of 2000s that innumerable microwave circuit topologies [8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26] are susceptible to behave as an NGD function. In 2010s, one of the most explored NGD circuits are based on the microstrip transmission line (TL) [8][9][15][16][17][21][22][23].…”

Section: Introductionmentioning

confidence: 99%

“…In 2010s, one of the most explored NGD circuits are based on the microstrip transmission line (TL) [8][9][15][16][17][21][22][23]. Among the TLbased NGD topologies, the circuits designed with coupledline (CL) ones [22][23][24] seem to be the best candidate against the issues related to the attenuation loss. Until now, the degree of freedom of topologies using CL structure motivates the NGD researchers to exploit the structure.…”

Section: Introductionmentioning

confidence: 99%

“…Despite the progressive development of the research works on the NGD circuit design [8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24], the NGD functions are not still open to most of non-specialist electronic design, fabrication and sale engineers. Many questions remain technically open about the meaning and the interpretation of the NGD effect.…”

Section: Introductionmentioning

confidence: 99%

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Experimental Time-Domain Study for Bandpass Negative Group Delay Analysis With Lill-Shape Microstrip Circuit

et al. 2021

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This paper focuses on the time-domain analysis of bandpass (BP) negative group delay (NGD) function. The innovative NGD investigation is based on the time-domain experimentation of an innovative topology of "lill"-shape passive microstrip circuit. The design principle of the proof of concept (POC) constituted by particular microstrip shapes is described. The NGD circuit is inspired from a recent fully distributed "li"-topology. Before the time-domain investigation, the BP NGD specifications of the circuit under study are academically defined. As practical application of the basic definition, a frequency domain validation of "lill"-circuit is presented in the first section of the paper. The POC circuit is specified by a -8 ns NGD value at 2.31 GHz NGD center frequency and a 27 MHz NGD bandwidth. The "lill"-circuit exhibits an attenuation loss of about -6.2 dB at the NGD center frequency. Then, the two-port black box model of "lill"-NGD-circuit represented by touchstone data of the measured S-parameters is exploited for the transient simulation. The measured group delay (GD) illustrates that the tested "lill"-circuit operates as a BP function regarding the NGD with NGD equal to -8.1 ns at the NGD center frequency. The timedomain demonstration of the BP NGD function was performed using a gaussian pulse modulating sine carrier. The innovative experimental setup with the possibility to plot simultaneously well synchronized input and output signals is explained. The BP NGD time-domain response is understood from commercial tool simulation using the touchstone S-parameters of the measured "lill"-circuit by using a Gaussian upconverted pulse having a 27 MHz frequency bandwidth. It was observed that the output signals are delayed when the sine carrier is out of NGD-band. However, the output signal envelope is in advanced of about -8 ns when the carrier is tuned to be approximately equal to the 2.31 GHz NGD center frequency. To confirm the time-domain typical behavior of BP NGD response, an input pulse signal having Gaussian waveform were considered during the test. However, the input signal spectrum must be determined in function of the NGD bandwidth. After tests, measured output signal envelopes presenting leading edge, trailing edge and peak in time-advance compared to the input ones are observed experimentally. The results of the present feasibility study open a potential microwave communication application of BP NGD function notably for systems operating with ISM and IEEE 802.11 standards.

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Section: Discussion On the Bp Ngd Performance Of The Proposed Circuitmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Experimental Time-Domain Study for Bandpass Negative Group Delay Analysis With Lill-Shape Microstrip Circuit

et al. 2021

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“…To satisfy the GD compensation for multiband devices, it is important to increase the number of operation bands of NGDCs. Over the last decade, several dualband NGDCs have been designed [14][15][16][17][18][19][20]. In [14], a dual-band NGDC based on right/left-handed λ/4 shorted stubs is proposed.…”

Section: Introductionmentioning

confidence: 99%

A Low-Loss Dual-Band Negative Group Delay Circuit With Flexible Design

Meng¹,

Wang²,

Bai³

et al. 2021

PIER Letters

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A low-loss dual-band negative group delay circuit (NGDC) with a flexible design is proposed. The proposed NGDC consists of a transmission line coupled asymmetrically with two stepimpedance open-loop resonators. The negative group delay (NGD) times and center frequencies of the lower and upper bands can be tuned independently. To verify the design concept, two dual-band NGDC prototypes I and II are fabricated and measured. The measured NGD times of prototype I are −4.9 ns and −4.8 ns at the center frequencies of 1.949 GHz and 2.054 GHz, respectively. The insertion loss is lower than 2.7 dB and the return loss larger than 11.2 dB in both NGD bands. For prototype II, the NGD times at 1.949 GHz and 2.086 GHz are −4.7 ns and −3.3 ns, respectively. The measured insertion loss is better than 2.4 dB with the return loss larger than 11.9 dB.

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Multi‐band pass negative group delay circuit with low insertion loss

Chang,

Yuan,

Wang

et al. 2024

Circuit Theory & Apps

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A novel multi‐band pass negative group delay circuit has been designed and proposed. The circuit consists of three types of components: capacitance, inductance, and resistance. An n‐order bandpass negative group delay circuit was analyzed and presented, and taking a three‐frequency bandpass negative group delay circuit as an example, the influence of different component values on the circuit group delay and insertion loss was analyzed. The actual test results of this circuit are consistent with the simulation results, and it can achieve the function of a multi‐bandpass circuit. In actual testing, the circuit frequencies with negative group delay are 49, 82, and 102 MHz, with corresponding group delay values of −2.177, −2.058, and −1.903 ns and corresponding insertion loss values of −5.810, −5.835, and −5.866 dB.

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Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines

Cited by 28 publications

References 40 publications

Experimental Time-Domain Study for Bandpass Negative Group Delay Analysis With Lill-Shape Microstrip Circuit

Experimental Time-Domain Study for Bandpass Negative Group Delay Analysis With Lill-Shape Microstrip Circuit

A Low-Loss Dual-Band Negative Group Delay Circuit With Flexible Design

Multi‐band pass negative group delay circuit with low insertion loss

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