Analysis strategy for internal measurements on VLSI devices

Electrical characterization of megabit DRAMs. 11. Internal testing

“…Also important are chip manipulation a n d repair. 4 Selectively separating interconnections can help isolate a n electrical malfunction a n d identify a possible e n c e d the chip's general functionality.…”

Internal Measurements for Failure Analysis and Chip Verification of Vlsi Circuits

“…In an extreme case of failure analysis the storage function of a memory device was crippled by systematic defects inside the chip's periphery which could be observed, localized and identified. A further step taken was laser manipulation at the chip level, which restored the chip's functionality [6] The comprehensive analysis strategy used here places a greater emphasis on verifying the failure cause through chip manipulation, resulting in a steeper learning curve during the product development.…”