Analysis on the Temperature-Dependence of the Flow Stress in Metallic Thin Films Based on an Exponential Decay Model

Duryat, Rahmat Saptono; Kim, Choong Un

doi:10.1166/asl.2014.5725

adv sci lett

2014

DOI: 10.1166/asl.2014.5725

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Analysis on the Temperature-Dependence of the Flow Stress in Metallic Thin Films Based on an Exponential Decay Model

Rahmat Saptono Duryat

Choong Un Kim²

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Analysis on the Temperature-Dependence of the Flow Stress in Metallic Thin Films Based on an Exponential Decay Model

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