2004
DOI: 10.1016/j.jallcom.2004.03.138
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Analysis on interfacial reactions between Sn–Zn solders and the Au/Ni electrolytic-plated Cu pad

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Cited by 77 publications
(55 citation statements)
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“…Transmission geometry and the high penetration depth of synchrotron radiation allow diffraction data to be obtained from representative large sample volumes. The diffraction data were collected using an area detector, located at a distance of 1070 mm from the sample, with a beam size of 0.5 9 0.5 mm 2 . To ensure that the optimal volume of Sn-Zn0.2Na/Ni is in the beam, the sample was measured at three different sites across the interface.…”
Section: Methodsmentioning
confidence: 99%
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“…Transmission geometry and the high penetration depth of synchrotron radiation allow diffraction data to be obtained from representative large sample volumes. The diffraction data were collected using an area detector, located at a distance of 1070 mm from the sample, with a beam size of 0.5 9 0.5 mm 2 . To ensure that the optimal volume of Sn-Zn0.2Na/Ni is in the beam, the sample was measured at three different sites across the interface.…”
Section: Methodsmentioning
confidence: 99%
“…1,[3][4][5][6] The microstructures of soldered joints with Sn-9Zn binary alloys were investigated, as were their interfaces with Cu. 2,[6][7][8][9] However, coupon testing demonstrated a thickening of the Cu 5 Zn 8 phase layer at the interface, as well as the formation of voids, with increasing aging time. 10 Therefore, the Ni layer at the interface caused the formation of intermetallic compounds (IMCs) from the Cu-Zn system to be blocked, 2,[11][12][13] and allowed the formation of Sn-Ni-Zn phases.…”
Section: Introductionmentioning
confidence: 99%
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