Analysis of wireless device-to-device networks under Rician fading using stochastic geometry

Demey, Simon; Wiame, Charles; Vandendorpe, Luc; Oestges, Claude

doi:10.1109/vtc2020-fall49728.2020.9348818

Cited by 1 publication

(1 citation statement)

References 24 publications

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“…Additionally, [30] explores the impact of the coexistence of sub-6GHz and mmWave BSs in networks on the EMF exposure. The joint study of SINR coverage and EMF exposure is introduced in [31] for β-Ginibre point processes and I-PPPs, followed by works such as [32] for Manhattan networks and [33] for usercentric cell-free massive MIMO networks. These works focus on the DL.…”

Section: A Related Workmentioning

confidence: 99%

A Stochastic Geometry Approach to EMF Exposure Modeling

Gontier

Petrillo²,

Rottenberg

et al. 2021

IEEE Access

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Downlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson point process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived from a simple propagation model taking into account the height of the base stations. The error on exposure made by taking a limited number of base stations, instead of the whole set, is quantified. The relative impact of the model parameters on the statistics of exposure is highlighted. The method is then applied and the model parameters are calibrated using experimental data obtained by drive-tests in two Brussels municipalities, in Belgium, for the 2100 MHz and 2600 MHz frequency bands. It is shown that the proposed model fits experimental values, paving the way to a new methodology to assess general public exposure to electromagnetic fields, for any frequency band. An insight is given on how to apply the methodology to a real case without access to experimental data.

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