Analysis of the transient Joule heating effect in a conductive-bridge random-access memory (CBRAM) using a single-phase-lag (SPL) model

Echouchene, Fraj; Jemii, Elassaad

doi:10.1007/s10825-021-01681-z

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Analysis of the transient Joule heating effect in a conductive-bridge random-access memory (CBRAM) using a single-phase-lag (SPL) model

Cited by 6 publications

References 39 publications

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