Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy

Aubert, S.; Bruyant, Aurélien; Blaize, Sylvain; Bachelot, Renaud; Lerondel, Gilles; Hudlet, Sylvain; Royer, Pascal

doi:10.1364/josab.20.002117

Cited by 42 publications

(34 citation statements)

References 18 publications

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“…As described in the Appendix and in Ref. 21,37 , and 41 , if the collected scattering losses E d are not small, the s-SNOM images R nf ͑x , y , z͒ exhibit recognizable oblique fringes that can be used ͑cf. Sec.…”

Section: B S-snom Setup and Signalmentioning

confidence: 97%

“…In addition to the tip scattered field, the scattering losses in the collection zone are also collected, leading to an intrinsic interferometric signal. 37 It has been previously shown that the radiation losses cannot be suppressed by only modulating the tip in tapping mode and by using a lock-in detection at the tip vibration frequency f ͑see the Appendix͒. However, using a heterodyne detection scheme, the radiation losses effect can be canceled as proposed by Keilmann and co-workers.…”

Section: A Motivations For the S-snom Approachmentioning

confidence: 99%

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Local complex reflectivity in optical waveguides

et al. 2006

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With the aim of probing the photonic band structure of waveguiding micro-and nanooptical devices, we re-introduce the modal local complex reflectivity ͑LCR͒ and review the impact of scanning near-field optical microscopy ͑SNOM͒ methods on the determination of LCR in such devices. These methods include intensity and complex field mapping of standing waves, as a function of the wavelength. A unified treatment of the LCR probing is given for both standard SNOM and phase sensitive SNOM. Experimental demonstration of these two methods on several microstructured devices ͑Bragg grating structures͒ is done using a scattering-type SNOM whose specific advantages in terms of resolution and accuracy are addressed. The phase sensitive version of the scattering-type SNOM is shown to be very well suited for LCR measurement as well as general modal and dispersion analysis. The possibility to obtain the scattering matrix of micro-and nanodevices as a function of the wavelength is foreseen by using the described microscope.

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Section: B S-snom Setup and Signalmentioning

confidence: 97%

Section: A Motivations For the S-snom Approachmentioning

confidence: 99%

Local complex reflectivity in optical waveguides

et al. 2006

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“…Such effects include optical interference patterns created between the scattered field and the background evanescent illumination field (E b ) present on the sample surface. This interference effect has been an issue that has long plagued apertureless SNOM [69], but heterodyne detection permits one to control this effect. This is possible because the E b × E s cross term is modulated only at nf , and not nf − ∆f , so that lock-in detection at nf − ∆f removes the unwanted cross term.…”

Section: Apertureless Heterodyne Detectionmentioning

confidence: 99%

Near-field optical imaging of noble metal nanoparticles

Wiederrecht

2004

Eur. Phys. J. Appl. Phys.

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Abstract.A review of the subject of near-field optical imaging of metal nanoparticles is presented. The emphasis of the review is on experimental achievements in optical imaging of single metal nanoparticles and nanostructured arrays with metal nanoparticle building blocks. The importance of the measurements as they relate to nano-optical applications and scientific understanding of optical near-fields is highlighted. Advancements in scanning near-field optical microscopy (SNOM) that have enabled near-field images of these structures are also featured, as are theoretical contributions for interpreting SNOM images.

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“…As for Figure 5, the ASNOM image exhibits three interference patterns. Recently, Aubert et al (2003) brought to the fore the interferometric nature of the ASNOM signal. The observed patterns can be related to three interference terms: the standing wave pattern (A) due to the interference between the forward and backward propagating modes (see previous section) and the non-local interferences, indicated by B (respectively C), occurring between the forward (respectively backward) mode scattered by the tip and the losses in the detection zone.…”

Section: Characterization Of Photonic Structuresmentioning

confidence: 99%

Probing photonic and optoelectronic structures by Apertureless Scanning Near‐Field Optical Microscopy

Bachelot

Lerondel

Blaize

et al. 2004

Microscopy Res & Technique

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This report presents the Apertureless Scanning Optical Near-Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub-wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few years. By significant examples, it is shown that this specific probe microscopy allows for in situ local quantitative study of semiconductor lasers in operation, integrated optical waveguides produced by ion exchange (single channel or Y junction), and photonic structures.

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Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy

Cited by 42 publications

References 18 publications

Local complex reflectivity in optical waveguides

Local complex reflectivity in optical waveguides

Near-field optical imaging of noble metal nanoparticles

Probing photonic and optoelectronic structures by Apertureless Scanning Near‐Field Optical Microscopy

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