Probing photonic and optoelectronic structures by Apertureless Scanning Near‐Field Optical Microscopy

Bachelot, Renaud; Lerondel, Gilles; Blaize, Sylvain; Aubert, S.; Bruyant, Aurélien; Royer, Pascal

doi:10.1002/jemt.20102

Cited by 26 publications

(18 citation statements)

References 41 publications

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“…As described in the Appendix and in Ref. 21,37 , and 41 , if the collected scattering losses E d are not small, the s-SNOM images R nf ͑x , y , z͒ exhibit recognizable oblique fringes that can be used ͑cf. Sec.…”

Section: B S-snom Setup and Signalmentioning

confidence: 99%

“…II B. Recently, we have reported on the LCR retrieval of two single-mode Bragg gratings structures 20,21 consisting in a corrugated ion exchanged waveguide and a fiber Bragg grating. In this part, we will comment further on the obtained results as well as on the normalization procedure.…”

Section: B Intensity Mapping: Lcr Retrievalmentioning

confidence: 99%

“…20,21 The basic idea of the method is to map the field intensity prior to the reflection zone under study. The analysis of the standing waves as a function of the wavelength enables one to determine the local complex reflection coefficient of the whole structure located after the scanning area.…”

Section: Introductionmentioning

confidence: 99%

“…As a beautiful example, the pulse delay method has recently been combined with phase sensitive scanning-near-field optical microscopy ͑SNOM͒, 18 in order to locally study the dispersion properties of photonic crystal waveguides. 19 Several others techniques based on tunable coherent sources [20][21][22] or low coherence sources can also be investigated for local dispersion measurements.…”

Section: Introductionmentioning

confidence: 99%

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Local complex reflectivity in optical waveguides

et al. 2006

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With the aim of probing the photonic band structure of waveguiding micro-and nanooptical devices, we re-introduce the modal local complex reflectivity ͑LCR͒ and review the impact of scanning near-field optical microscopy ͑SNOM͒ methods on the determination of LCR in such devices. These methods include intensity and complex field mapping of standing waves, as a function of the wavelength. A unified treatment of the LCR probing is given for both standard SNOM and phase sensitive SNOM. Experimental demonstration of these two methods on several microstructured devices ͑Bragg grating structures͒ is done using a scattering-type SNOM whose specific advantages in terms of resolution and accuracy are addressed. The phase sensitive version of the scattering-type SNOM is shown to be very well suited for LCR measurement as well as general modal and dispersion analysis. The possibility to obtain the scattering matrix of micro-and nanodevices as a function of the wavelength is foreseen by using the described microscope.

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Section: B S-snom Setup and Signalmentioning

confidence: 99%

Section: B Intensity Mapping: Lcr Retrievalmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Local complex reflectivity in optical waveguides

et al. 2006

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“…The fabrication sequence is analogous to that of the tipless probe, except that the FIB milling process is modified in 2 ways: (1) the sharp tip is truncated, as shown in Fig. 6, (2) and Ga+ ions with an accelerating field of 30kV and applied current of 30pA were used. Milling from the side of the pyramid results in an elevated platform containing a metal ring, as shown in Fig.…”

Section: Fabrication Of Oled On Tipped Silicon Cantileversmentioning

confidence: 99%

Cantilevers with integrated organic LEDs for scanning probe microscopy

O’Connor

Zhao

et al. 2007

SPIE Proceedings

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Organic thin films which are based on Van der Waals-bonded molecular organic compounds can be deposited onto a variety of substrates including scanning probe cantilevers without the lattice-matching constraints of conventional covalently-bonded semiconductors. Here we demonstrate organic light-emitting devices (OLEDs) fabricated on scanning probe cantilevers using thermal evaporation of molecular organic compounds and metallic electrodes. Ion beam lithography was used to define the emissive region in the shape of a ring having a diameter of 5 micrometers. The width of the ring emission was less than a micron as measured in the far field. Stable light emission was observed from the device at forward bias, with a current-voltage response similar to that of archetypal OLEDs. Such a probe can enable a new form of electrically-pumped SNOM compatible with existing atomic force microscopy tools and techniques. The emission wavelength can be tuned across the entire visible spectrum, including white light emission, by altering the composition of the emissive layer with a wide range of luminescent dyes. Should the ring-shaped light emission be used for imaging, the sample image can be deconvolved using a ring filter to achieve high resolution. The OLED probe can also be used to transfer excitons through the cathode to a sample via plasmon-assisted energy transfer; such a probe would be valuable for studying exciton dynamics in organic or organic/inorganic hybrid photovoltaic devices. By demonstrating the first active organic device on a scanning probe cantilever, this work opens the door to a wide range of new scanning probe techniques based on this class of materials for areas such as biological imaging.

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Experimental Characterization of Nanomaterials

Jackson

2011

Nanoscale Multifunctional Materials

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Probing photonic and optoelectronic structures by Apertureless Scanning Near‐Field Optical Microscopy

Cited by 26 publications

References 41 publications

Local complex reflectivity in optical waveguides

Local complex reflectivity in optical waveguides

Cantilevers with integrated organic LEDs for scanning probe microscopy

Experimental Characterization of Nanomaterials

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