2015
DOI: 10.1016/j.tsf.2014.10.073
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Analysis of the back contact properties of Cu(In,Ga)Se 2 solar cells employing the thermionic emission model

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Cited by 15 publications
(9 citation statements)
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“…Finally, molybdenum has been the prime substrate for most studies on CuInS 2 -based PV devices, a choice largely driven by the success achieved with Cu(In,Ga)Se 2 solar cells on this electrical back-contact. 22 Integrating Cu(In,Ga)S 2 on a transparent conductive F:SnO 2 (FTO) substrate, however, is a much more challenging task, as this material tends to react readily with sulfur to form resistive SnS x . 23,24 This implies that direct coevaporation of Cu(In,Ga)S 2 on FTO should be avoided, as SnS x would inevitably form at the absorber/back-contact interface during the initial stage of deposition.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, molybdenum has been the prime substrate for most studies on CuInS 2 -based PV devices, a choice largely driven by the success achieved with Cu(In,Ga)Se 2 solar cells on this electrical back-contact. 22 Integrating Cu(In,Ga)S 2 on a transparent conductive F:SnO 2 (FTO) substrate, however, is a much more challenging task, as this material tends to react readily with sulfur to form resistive SnS x . 23,24 This implies that direct coevaporation of Cu(In,Ga)S 2 on FTO should be avoided, as SnS x would inevitably form at the absorber/back-contact interface during the initial stage of deposition.…”
Section: Introductionmentioning
confidence: 99%
“…The electrical properties of the CIGS/FTO back contact were further investigated to clarify if the blocking diode model applies to this interface. For this analysis, the ITO/ZnO/CdS top layers of the CIGS cell were etched in a 10% HCl solution for 5 minutes and replaced by 100 nm-thick (area: 0.015 cm 2 ) gold ohmic contacts [53][54][55] evaporated directly onto the etched CIGS absorber. As presented in Figure 5(a), all J-V-T characteristics measured in dark between 300K and 140K on Au/CIGS/FTO are linear and intersects the origin, revealing that an ohmic contact, rather than a blocking barrier, is formed at the CIGS/FTO back interface.…”
Section: Ii) Early Freeze-out Of Dominant Acceptors In Cigsmentioning
confidence: 99%
“…The rollover anomaly is described to be a current saturation in the first quadrant of the JV curve, that is, under forward bias, revealing a charge carrier injection barrier 23,32 . The first possible cause for that behavior is the presence of a back‐contact barrier representing a hole injection barrier at the CIGSe/Mo interface 23,32–38 . Another possible cause is acceptor states at the CdS/ZnO front interface 23 .…”
Section: Principle Scaps‐1d Models For Possible Degradationmentioning
confidence: 99%