Analysis of stress and strain distribution in thin films and substrates

Röll, K.

doi:10.1063/1.323119

Cited by 183 publications

(43 citation statements)

References 3 publications

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“…The process-induced internal stress in the ITOA coating, σ ir , was determined along MD (i = 1) and TD (i = 2) from radius of curvature measurements on 60 × 5.5 mm 2 rectangular samples, following the analysis of Röll [20]:…”

Section: Materials and Experimental Methodsmentioning

confidence: 99%

Influences of roll-to-roll process and polymer substrate anisotropies on the tensile failure of thin oxide films

et al. 2010

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The influence of internal stress anisotropy resulting from anisotropic loading in a roll-to-roll (R2R) process, and polymer substrate anisotropy on the crack onset strain (COS) of thin oxide coatings was analyzed. Experimental data obtained for R2R processed films were compared with data obtained using an isotropic sheet-to-sheet (S2S) process with the same anisotropic substrate. In the R2R case the COS was found to increase by 20% between the transverse direction and the machine direction. In the S2S case the COS was found to be independent of orientation, except at a 45°in-plane orientation with respect to the machine direction, where it was 15% higher. The internal stress in the machine direction could not be determined, presumably due to deposition-induced curvature changes of the polymer substrate, and was therefore fitted to the COS data. Fracture mechanics analysis and finite element modeling of the experimental data showed that the influence of substrate anisotropy was marginal, and that it was the process-induced internal strain in the coating which controlled the COS.

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Section: Materials and Experimental Methodsmentioning

confidence: 99%

Influences of roll-to-roll process and polymer substrate anisotropies on the tensile failure of thin oxide films

et al. 2010

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“…In-plane deposition-induced internal stresses, σ i , were calculated using the radius of curvature of the films before, R 1 , and after, R 2 , deposition [2,20]:…”

Section: Experimental Methodsmentioning

confidence: 99%

Mechanical properties of SiOx gas barrier coatings on polyester films

Howells¹,

Henry²,

Leterrier³

et al. 2008

Surface and Coatings Technology

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This paper reports the impressive mechanical properties of 1 μm thick carbon-containing SiO x gas barrier coatings, characterised using the uniaxial fragmentation test. Such coatings have been found to act as excellent barriers to water vapour permeation partly because they can be made so thick without stress induced cracking. The impressive mechanical properties are thought to be due in part to the high amount of carbon they contain, which gives them a more organic character, as well as the fact that they are deposited as a succession of thinner layers. The adhesion of the coatings to the polyester film is good in all cases, reflecting a high density of covalent bonding at the interface. Improvement of the mechanical properties of a SiO x /PET composite can be achieved by altering the substrate. By replacing the PET with a heat-stabilised (HS) PET film, a HS film with an acrylate layer or PEN, it is found that the coating displays improved mechanical properties and adhesive strength (as well as barrier). This is thought to be due to the superior surface thermal and mechanical properties of these substrates. Deposition temperatures are at least 80°C, which causes molecular motion at the surface of a plain PET film and creates defects in the SiO x coating as it grows, making it more brittle and permeable to gas flow.

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“…Stoney's formula has been modified many times for the purpose of evaluating bilayer and multilayer structures with arbitrary layer thickness ratios. [2][3][4][5][6][7][8][9][10][11][12][13] Klein made comments on the accuracy of some modified Stoney formulas mentioned above. 14 The assumption of a uniform curvature is explicitly or implicitly used in the context of bilayer or multilayer structures modeled as either beams or plates.…”

Section: Introductionmentioning

confidence: 99%

“…14 The assumption of a uniform curvature is explicitly or implicitly used in the context of bilayer or multilayer structures modeled as either beams or plates. [2][3][4][5][6][7][8][9][10][11][12][13]15,16 Among these studies, Freund et al, in particular, presented an excellent analysis of the film/substrate bilayer and multilayer deflection due to lattice mismatch. [7][8][9] Freund et al also noted that the assumption of a uniform curvature is not valid for large nonlinear deformations.…”

Section: Introductionmentioning

confidence: 99%

Applicability range of Stoney’s formula and modified formulas for a film/substrate bilayer

Zhang

Zhao

2006

Journal of Applied Physics

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In addition to the layer thickness and effective Young's modulus, the impact of the kinematic assumptions, interfacial condition, in-plane force, boundary conditions, and structure dimensions on the curvature of a film/substrate bilayer is examined. Different models for the analysis of the bilayer curvature are compared. It is demonstrated in our model that the assumption of a uniform curvature is valid only if there is no in-plane force. The effects of boundary conditions and structure dimensions, which are not ͑fully͒ included in previous models are shown to be significant. Three different approaches for deriving the curvature of a film/substrate bilayer are presented, compared, and analyzed. A more comprehensive study of the conditions regarding the applicability of Stoney's formula and modified formulas is presented.

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Analysis of stress and strain distribution in thin films and substrates

Cited by 183 publications

References 3 publications

Influences of roll-to-roll process and polymer substrate anisotropies on the tensile failure of thin oxide films

Influences of roll-to-roll process and polymer substrate anisotropies on the tensile failure of thin oxide films

Mechanical properties of SiOx gas barrier coatings on polyester films

Applicability range of Stoney’s formula and modified formulas for a film/substrate bilayer

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